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High-Resolution Electron Microscopy for Materials Science

High-resolution electron microscopy (HREM) has become a most powerful method for investigating the internal structure of materials on an;

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MRS Proceedings Advances in Materials Problem Solving with the Electron Microscope

ALCHEMI, electron holography, EBSP in the SEM for phase identification and orientation imaging microscopy, low-voltage microanalysis of bulk;

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Characterization of High Tc Materials and Devices by Electron Microscopy

transmission electron microscopy, together with details of each technique and its applications. Introductory chapters cover the basics of high;

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Characterization of High Tc Materials and Devices by Electron Microscopy

transmission electron microscopy, together with details of each technique and its applications. Introductory chapters cover the basics of high;

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Scanning Transmission Electron Microscopy

Scanning Transmission Electron Microscopy is focused on discussing the latest approaches in the recording of high-fidelity quantitative;

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Scanning Transmission Electron Microscopy Of Nanomaterials

The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the;

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Quantitative Atomic-Resolution Electron Microscopy

Quantitative Atomic-Resolution Electron Microscopy, Volume 217, the latest release in the Advances in Imaging and Electron Physics series;

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The Principles and Practice of Electron Microscopy

The first edition of this book was widely praised as an excellent introduction to electron microscopy for materials scientists, physicists;

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Advances in Imaging and Electron Physics

the Resolution Limit of the Transmission Electron Microscope, Phase Plates for Transmission Electron Microscopy, and X-Ray Lasers in Biology;

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Introduction to Electron Microscopy for Biologists

of resolution) and digital light microscopy (at the low end, 100-200 nanometers).*Basic techniques in transmission and scanning electron;

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Aberration-corrected Imaging In Transmission Electron Microscopy: An Introduction (2nd Edition)

Aberration-Corrected Imaging in Transmission Electron Microscopy provides an introduction to aberration-corrected atomic-resolution;

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Reflection Electron Microscopy and Spectroscopy for Surface Analysis

In this book the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction;

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Reflection Electron Microscopy and Spectroscopy for Surface Analysis

In this book the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction;

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Compact Introduction to Electron Microscopy

Goerg Michler summarizes the large field of electron microscopy and clearly presents the different techniques. The author clearly describes;

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Electron Microscopy and Analysis 1997, Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Cambridge, 2-5 September 1997

Electron Microscopy and Analysis 1997 celebrates the centenary anniversary of the discovery of the electron by J.J. Thomson in Cambridge;

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Advanced Computing in Electron Microscopy

This updated and revised edition of a classic work provides a summary of methods for numerical computation of high resolution conventional;

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Advanced Computing in Electron Microscopy

This updated and revised edition of a classic work provides a summary of methods for numerical computation of high resolution conventional;

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Auger Electron Spectroscopy

alloys, semiconductors, nanostructures, and insulators. Its value as a tool for high-resolution elemental imaging and compositional depth;

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Scanning Electron Microscopy for the Life Sciences

-extraction for imaging with high resolution SEM, and advances in immuno-labeling. New developments include helium ion microscopy, automated block;

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Microscopy of Semiconducting Materials 1987, Proceedings of the Institute of Physics Conference, Oxford University, April 1987

. The book covers the state of the art, with sections on high resolution microscopy, epitaxial layers, quantum wells and superlattices, bulk;

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Sem of Plastics Failure

Scanning electron microscopy (SEM) is often used in plastics failure analysis when light microscopy cannot provide images of high enough;

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In situ Materials Characterization

using X-rays, electrons and neutrons are of very high interest to many researchers and is a fast-evolving and interesting field for the study;

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Microstructural Characterization Of Materials

of probe form the basis for optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy. Microstructural;

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Cellular Imaging Techniques for Neuroscience and Beyond

volume brings experts in high-resolution optical microscopy applications in neuroscience and cell biology together to document the state of the;

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Atom-Probe Field Ion Microscopy

surfaces and interfaces at atomic resolution. A useful comparison is given with two related techniques, electron microscopy and scanning tunnelling;

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Electron BeamSpecimen Interactions and Simulation Methods in Microscopy

and the specimen, the fundamental starting point for all electron microscopy. Detailed explanations are provided to help reinforce;

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Advances in Imaging and Electron Physics

Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor;

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