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Aberration-corrected Imaging In Transmission Electron Microscopy: An Introduction (2nd Edition)

Aberration-Corrected Imaging in Transmission Electron Microscopy provides an introduction to aberration-corrected atomic-resolution;

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Modeling Nanoscale Imaging in Electron Microscopy

Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve;

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Electron Nano Imaging

In this book, the bases of imaging and diffraction in transmission electron microscopy (TEM) and scanning transmission electron microscopy;

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Electron BeamSpecimen Interactions and Simulation Methods in Microscopy

aberration-corrected and monochromated microscopes. Electron Beam-Specimen Interactions and Simulation Methods in Microscopy offers enlightening;

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Applications of Microscopy in Materials and Life Sciences

include papers on aberration corrected TEM & STEM, SEM - FIB, ion beam microscopy, electron diffraction & crystallography, microscopy and imaging;

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Scanning Transmission Electron Microscopy Of Nanomaterials

The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the;

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The Principles and Practice of Electron Microscopy

The first edition of this book was widely praised as an excellent introduction to electron microscopy for materials scientists, physicists;

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Characterization of High Tc Materials and Devices by Electron Microscopy

experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning;

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Characterization of High Tc Materials and Devices by Electron Microscopy

experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning;

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Advanced Computing in Electron Microscopy

and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen;

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Advanced Computing in Electron Microscopy

and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen;

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Progress in Nanoscale Characterization and Manipulation

advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical;

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Microstructural Characterization Of Materials

Characterization of Materials, 2nd Edition is an introduction to the expertise involved in assessing the microstructure of engineering materials and to the;

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Advances in Imaging and Electron Physics

the Resolution Limit of the Transmission Electron Microscope, Phase Plates for Transmission Electron Microscopy, and X-Ray Lasers in Biology;

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Transmission Electron Microscopy

in transmission el- tron microscopy. Since the last edition, transmission electron microscopy has undergone a rapid evolution. The introduction;

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Nanocharacterisation

Electron Microscopy, Scanning Transmission Electron Microscopy, Scanning Probe Microscopy, Electron Energy Loss Spectroscopy and Energy Dispersive;

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Scanning Force Microscopy of Polymers

microscopy and different forms of electron microscopy (Scanning Electron Micr- copy, SEM; Transmission Electron Microscopy, TEM; Environmental;

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Introduction to Electron Microscopy for Biologists

of resolution) and digital light microscopy (at the low end, 100-200 nanometers).*Basic techniques in transmission and scanning electron;

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Scanning Transmission Electron Microscopy

Scanning Transmission Electron Microscopy is focused on discussing the latest approaches in the recording of high-fidelity quantitative;

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Advanced Optical Imaging Theory

illumination and the aberration theory for high numerical-aperture objectives. This book introduces these new theories in modern optical microscopy;

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New Horizons of Applied Scanning Electron Microscopy

In modern scanning electron microscopy, sample surface preparation is of key importance, just as it is in transmission electron microscopy;

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Transmission Electron Microscopy of Minerals and Rocks

. Transmission Electron Microscopy of Minerals and Rocks is an introduction to the principles of the technique written specifically for geologists and;

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Advances in Imaging and Electron Physics

in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices;

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Advanced Computing in Electron Microscopy

in this edition. New topics include aberration corrected instruments, scanning confocal mode of operations, Bloch wave eigenvalue methods and;

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Electron Microscopy and Analysis 1997, Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Cambridge, 2-5 September 1997

Electron Microscopy and Analysis 1997 celebrates the centenary anniversary of the discovery of the electron by J.J. Thomson in Cambridge;

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Advances in Imaging and Electron Physics

in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices;

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Advances in Imaging and Electron Physics

in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices;

Vergelijkbare producten zoals Advances in Imaging and Electron Physics