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Modeling Nanoscale Imaging in Electron Microscopy

Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve;

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Magnetic Microscopy of Nanostructures

A comprehensive collection of overview articles on novel microscopy methods for imaging magnetic structures on the nanoscale. Written by;

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Advances in Imaging and Electron Physics

Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor;

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Progress in Nanoscale Characterization and Manipulation

of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern;

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Aberration-corrected Imaging In Transmission Electron Microscopy: An Introduction (2nd Edition)

Aberration-Corrected Imaging in Transmission Electron Microscopy provides an introduction to aberration-corrected atomic-resolution;

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Electron Nano Imaging

In this book, the bases of imaging and diffraction in transmission electron microscopy (TEM) and scanning transmission electron microscopy;

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Characterization of High Tc Materials and Devices by Electron Microscopy

experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning;

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Characterization of High Tc Materials and Devices by Electron Microscopy

experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning;

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Advances in Imaging and Electron Physics

in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices;

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Advances in Imaging and Electron Physics

in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices;

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Advances in Imaging and Electron Physics

in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices;

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Advances in Imaging and Electron Physics

in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices;

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Advances in Imaging and Electron Physics

in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices;

Vergelijkbare producten zoals Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics

in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices;

Vergelijkbare producten zoals Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics

in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices;

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Advances in Imaging and Electron Physics

Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor;

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Physical Models of Living Systems

control networks, epidemic modeling, and superresolution and cryo-electron microscopy imaging. ;

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Atomic Force Microscopy Based Nanorobotics

-dimensional manipulation force microscopy and parallel imaging/manipulation force microscopy.;

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Surface Microscopy with Low Energy Electrons

This book, written by a pioneer in surface physics and thin film research and the inventor of Low Energy Electron Microscopy (LEEM), Spin;

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Advances in Imaging and Electron Physics

in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices;

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Advances in Imaging and Electron Physics

in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices;

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Quantitative Atomic-Resolution Electron Microscopy

Quantitative Atomic-Resolution Electron Microscopy, Volume 217, the latest release in the Advances in Imaging and Electron Physics series;

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Advances in Imaging and Electron Physics

in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices;

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Advances in Imaging and Electron Physics

& Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics;

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Advances in Imaging and Electron Physics

& Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics;

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Advances in Imaging and Electron Physics

& Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics;

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Advances in Imaging and Electron Physics

& Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics;

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