electron microscopy and analysis 1997 proceedings of the institute of physics electron microscopy and analysis group conference university of cambridge 2 5 september 1997 online kopen

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Electron Microscopy and Analysis 1997, Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Cambridge, 2-5 September 1997

Electron Microscopy and Analysis 1997 celebrates the centenary anniversary of the discovery of the electron by J.J. Thomson in Cambridge;

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Electron Microscopy and Analysis 2003

. Containing the proceedings from the Electron Microscopy and Analysis Group (EMAG) conference in September 2003, this volume covers current;

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Electron Microscopy; Proceedings of the Stockholm Conference, September, 1956

Vergelijkbare producten zoals Electron Microscopy; Proceedings of the Stockholm Conference, September, 1956

Electron Microscopy; Proceedings of the Stockholm Conference, September, 1956

Vergelijkbare producten zoals Electron Microscopy; Proceedings of the Stockholm Conference, September, 1956

EMC 2008: Vol 2

Microscopy Society (EMS), the German Society for Electron Microscopy (DGE) and the local microscopists from RWTH Aachen University and the Research;

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Compact Introduction to Electron Microscopy

Goerg Michler summarizes the large field of electron microscopy and clearly presents the different techniques. The author clearly describes;

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Characterization of High Tc Materials and Devices by Electron Microscopy

distributions is discussed. Final chapters consider applications of electron microscopy to the analysis of grain boundaries, thin films and device;

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Characterization of High Tc Materials and Devices by Electron Microscopy

distributions is discussed. Final chapters consider applications of electron microscopy to the analysis of grain boundaries, thin films and device;

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EMC 2008: Vol 3

Microscopy Society (EMS), the German Society for Electron Microscopy (DGE) and the local microscopists from RWTH Aachen University and the Research;

Vergelijkbare producten zoals EMC 2008: Vol 3

EMC 2008: Vol 3

Microscopy Society (EMS), the German Society for Electron Microscopy (DGE) and the local microscopists from RWTH Aachen University and the Research;

Vergelijkbare producten zoals EMC 2008: Vol 3

EMC 2008

Microscopy Society (EMS), the German Society for Electron Microscopy (DGE) and the local microscopists from RWTH Aachen University and the Research;

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EMC 2008: Vol 1

Microscopy Society (EMS), the German Society for Electron Microscopy (DGE) and the local microscopists from RWTH Aachen University and the Research;

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Advances in Imaging and Electron Physics Including Proceedings CPO-10

Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor;

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Microscopy of Semiconducting Materials 1987, Proceedings of the Institute of Physics Conference, Oxford University, April 1987

The various forms of microscopy and related microanalytical techniques are making unique contributions to semiconductor research and;

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Electron BeamSpecimen Interactions and Simulation Methods in Microscopy

and the specimen, the fundamental starting point for all electron microscopy. Detailed explanations are provided to help reinforce;

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Biomedical Electron Microscopy

microscopy, and computer-assisted image analysis. Authored by the key leaders in the biological electron microscopy field

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Advances in Imaging and Electron Physics

Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor;

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Particles and Waves in Electron Optics and Microscopy

in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices;

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Quantitative Atomic-Resolution Electron Microscopy

Quantitative Atomic-Resolution Electron Microscopy, Volume 217, the latest release in the Advances in Imaging and Electron Physics series;

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Advances in Imaging and Electron Physics

in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices;

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Scanning Transmission Electron Microscopy

annular dark-field (ADF) data. It showcases the application of machine learning in electron microscopy and the latest advancements in image;

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Advances in Imaging and Electron Physics

in Electronics and Electron Physics and Advances in Optical and Electron Microscopy features extended articles on the physics of electron devices;

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Scanning Electron Microscopy

Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The;

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Logarithmic Image Processing: Theory and Applications

, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy into a single volume Contains the latest;

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Surface Microscopy with Low Energy Electrons

This book, written by a pioneer in surface physics and thin film research and the inventor of Low Energy Electron Microscopy (LEEM), Spin;

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Advances in Imaging and Electron Physics

in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices;

Vergelijkbare producten zoals Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics

in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices;

Vergelijkbare producten zoals Advances in Imaging and Electron Physics