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Electron Microscopy; Proceedings of the Stockholm Conference, September, 1956

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Electron Microscopy; Proceedings of the Stockholm Conference, September, 1956

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Electron Microscopy and Analysis 2003

. Containing the proceedings from the Electron Microscopy and Analysis Group (EMAG) conference in September 2003, this volume covers current;

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Electron Microscopy and Analysis 1997, Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Cambridge, 2-5 September 1997

Electron Microscopy and Analysis 1997 celebrates the centenary anniversary of the discovery of the electron by J.J. Thomson in Cambridge;

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Applications of Microscopy in Materials and Life Sciences

This book comprises the proceedings of the 12th International Conference on Asia-Pacific Microscopy Conference (APMC12) focusing on;

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Free Electron Lasers 2003

This book contains the Proceedings of the 25th International Free Electron Laser Conference and the 10th Free Electron Laser Users Workshop;

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EMC 2008: Vol 3

Proceedings of the14th European Microscopy Congress, held in Aachen, Germany, 1-5 September 2008. Jointly organised by the European;

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EMC 2008: Vol 3

Proceedings of the14th European Microscopy Congress, held in Aachen, Germany, 1-5 September 2008. Jointly organised by the European;

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EMC 2008

Proceedings of the14th European Microscopy Congress, held in Aachen, Germany, 1-5 September 2008. Jointly organised by the European;

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EMC 2008: Vol 2

Proceedings of the14th European Microscopy Congress, held in Aachen, Germany, 1-5 September 2008. Jointly organised by the European;

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EMC 2008: Vol 1

Proceedings of the14th European Microscopy Congress, held in Aachen, Germany, 1-5 September 2008. Jointly organised by the European;

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Free Electron Lasers 2002

This book contains the Proceedings of the 24th International Free Electron Laser Conference and the 9th Free Electron Laser Users Workshop;

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Microscopy of Semiconducting Materials 1987, Proceedings of the Institute of Physics Conference, Oxford University, April 1987

The various forms of microscopy and related microanalytical techniques are making unique contributions to semiconductor research and;

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Advances in Engineering Materials

microscopy, and gel electrophoresis chromatography. This book gives the readers an insight into advanced material processes and characterizations;

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Advances in Imaging and Electron Physics Including Proceedings CPO-10

Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor;

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Characterization of High Tc Materials and Devices by Electron Microscopy

transmission electron microscopy, together with details of each technique and its applications. Introductory chapters cover the basics of high;

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Characterization of High Tc Materials and Devices by Electron Microscopy

transmission electron microscopy, together with details of each technique and its applications. Introductory chapters cover the basics of high;

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Biomedical Electron Microscopy

problems. Not only will the basic methodologies of transmission electron microscopy like fixation, microtomy, and microscopy be presented, but the;

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New Horizons of Applied Scanning Electron Microscopy

microscopes can be realized fully. This will take the reader to an entirely new level of scanning electron microscopy and finely-detailed images never;

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Semiconductor Surface Physics

Proceedings of the Conference on the Physics of Semiconductor Surfaces, June 1956.;

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MRS Proceedings Advances in Materials Problem Solving with the Electron Microscope

ALCHEMI, electron holography, EBSP in the SEM for phase identification and orientation imaging microscopy, low-voltage microanalysis of bulk;

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Introduction to Electron Microscopy for Biologists

of resolution) and digital light microscopy (at the low end, 100-200 nanometers).*Basic techniques in transmission and scanning electron;

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Surface Microscopy with Low Energy Electrons

This book, written by a pioneer in surface physics and thin film research and the inventor of Low Energy Electron Microscopy (LEEM), Spin;

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Advances in Imaging and Electron Physics

The subjects reviewed in the Advances in Imaging and Electron Physics series cover a broad range of themes including microscopy;

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MRS Proceedings Materials Characterization

, infrared spectroscopy, scanning electron microscopy and transmission electron microscopy; characterization of pipeline steels used in the oil;

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Aberration-corrected Imaging In Transmission Electron Microscopy: An Introduction (2nd Edition)

electron microscopy imaging in materials and physical sciences. It covers both the broad beam transmission mode (TEM; transmission electron;

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Scanning Electron Microscopy

Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The;

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