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Auger Electron Spectroscopy

of other types of analysis for which an Auger electron spectrometer may be used, for example, secondary electron microscopy, backscattered electron;

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Characterization of Metals and Alloys

thin films processesConcise summaries of major characterization technologies for metals and alloys, including Auger Electron Spectroscopy;

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Characterization In Compound Semiconductor Processing

Concise summaries of major characterization technologies for compound semiconductor materials, including Auger Electron Spectroscopy, Ballistic;

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Quantitative Microbeam Analysis

describes the current advances. The book highlights developments relating to Auger electron spectroscopy in scanning electron microscopes and;

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Characterization Of Integrated Circuit Packaging Materials

characterization technologies for integrated circuit packaging materials, including acoustic microscopy, atomic absorption spectrometry, Auger Electron;

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Characterization in Silicon Processing

Electron Spectroscopy, Energy-Dispersive X-Ray Spectroscopy, Neutron Activation Analysis and Raman Spectroscopy;

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Surface Science

of techniques developed to reveal the structure and chemistry of surfaces are explored including auger electron spectroscopy, photoelectron spectroscopy;

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Trends in Surface Science Research

of techniques developed to reveal the structure and chemistry of surfaces are explored including auger electron spectroscopy, photoelectron spectroscopy;

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Focus on Surface Science Research

of techniques developed to reveal the structure and chemistry of surfaces are explored including auger electron spectroscopy, photoelectron spectroscopy;

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Surface Science Research

of techniques developed to reveal the structure and chemistry of surfaces are explored including auger electron spectroscopy, photoelectron spectroscopy;

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Characterization of Organic Thin Films

SpectroscopyConcise Summaries of major characterization technologies for organic thin films, including Auger Electron Spectroscopy, Dynamic Secondary Ion Mass;

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An Introduction to Surface Analysis by XPS and AES

Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) techniques. It starts with an examination of the basic concepts of electron;

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Scanning Electron Microscopy

different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons;

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Scanning Auger Electron Microscopy

is given to the underlying science of the method of Auger microscopy, and its instrumental realization, the visualization and interpretation of the;

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Characterization of Optical Materials

spectrometry, Auger Electron Spectroscopy, Energy-Dispersive X-Ray Spectroscopy, and many more;

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Electron Paramagnetic Resonance Spectroscopy

This book shows how the fundamentals of electron paramagnetic resonance (EPR) spectroscopy are practically implemented and illustrates the;

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Electron Paramagnetic Resonance Spectroscopy

This book shows how the fundamentals of electron paramagnetic resonance (EPR) spectroscopy are practically implemented and illustrates the;

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Electron Energy-Loss Spectroscopy in the Electron Microscope

Within the last 30 years, electron energy-loss spectroscopy (EELS) has become a standard analytical technique used in the transmission;

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Electron Energy-Loss Spectroscopy in the Electron Microscope

Within the last 30 years, electron energy-loss spectroscopy (EELS) has become a standard analytical technique used in the transmission;

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Electron Energy Loss Spectroscopy

Electron Energy Loss Spectroscopy (EELS) is a high resolution technique used for the analysis of thin samples of material. The technique;

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Reflection Electron Microscopy and Spectroscopy for Surface Analysis

(RHEED) and reflection electron energy-loss spectroscopy (REELS) are comprehensively reviewed for the first time. The book is divided into three;

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Reflection Electron Microscopy and Spectroscopy for Surface Analysis

(RHEED) and reflection electron energy-loss spectroscopy (REELS) are comprehensively reviewed for the first time. The book is divided into three;

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Modern Esca

of electron spectroscopy generally labeled as either Electron Spectroscopy for Chemical Analysis (ESCA) or X-ray Photoelectron Spectroscopy (XPS). The;

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Recent Progress in Spectroscopy

spectroscopy. Other spectroscopic methods like auger spectroscopy, hadron spectroscopy, photoacoustic spectroscopy, spin noise spectroscopy, etc. are;

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Inductively Coupled Plasma Emission Spectroscopy, Part 1

are the most up-to-date treatments available on these subjects. 826 pp. (0 471-86848-5) 1985 Auger Electron Spectroscopy M. Thompson, M. Baker;

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Modern Spectroscopy

theory and applications to structure determination and chemical analysis. It covers rotational, vibrational, electronic, photoelectron and Auger;

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Modern Spectroscopy 4th

theory and applications to structure determination and chemical analysis. It covers rotational, vibrational, electronic, photoelectron and Auger;

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