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Electron Energy-Loss Spectroscopy in the Electron Microscope

Within the last 30 years, electron energy-loss spectroscopy (EELS) has become a standard analytical technique used in the transmission;

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Electron Energy-Loss Spectroscopy in the Electron Microscope

Within the last 30 years, electron energy-loss spectroscopy (EELS) has become a standard analytical technique used in the transmission;

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Electron Microscopy and Analysis 1997, Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Cambridge, 2-5 September 1997

P. Hawkes), the development of the scanning electron microscope at Cambridge (from K. Smith), electron energy loss spectroscopy (from L.M;

Vergelijkbare producten zoals Electron Microscopy and Analysis 1997, Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Cambridge, 2-5 September 1997

Electron Energy Loss Spectroscopy

Electron Energy Loss Spectroscopy (EELS) is a high resolution technique used for the analysis of thin samples of material. The technique;

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Reflection Electron Microscopy and Spectroscopy for Surface Analysis

(RHEED) and reflection electron energy-loss spectroscopy (REELS) are comprehensively reviewed for the first time. The book is divided into three;

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Reflection Electron Microscopy and Spectroscopy for Surface Analysis

(RHEED) and reflection electron energy-loss spectroscopy (REELS) are comprehensively reviewed for the first time. The book is divided into three;

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Scanning Transmission Electron Microscopy Of Nanomaterials

advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software;

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MRS Proceedings Advances in Materials Problem Solving with the Electron Microscope

This book was motivated by the remarkable advances that continue to be made in electron microscope instrumentation and techniques for;

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Characterization of High Tc Materials and Devices by Electron Microscopy

This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading;

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Characterization of High Tc Materials and Devices by Electron Microscopy

This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading;

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Advances in Imaging and Electron Physics

, electron microscopy and the computing methods used in all these domains. Sections in this new release cover Electron energy loss spectroscopy at;

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Nanocharacterisation

Electron Microscopy, Scanning Transmission Electron Microscopy, Scanning Probe Microscopy, Electron Energy Loss Spectroscopy and Energy Dispersive;

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Nanocharacterisation

characterisation methods including, Transmission Electron Microscopy, Electron Tomography, Tunneling Microscopy, Electron Holography, Electron Energy Loss;

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Surface Microscopy with Low Energy Electrons

This book, written by a pioneer in surface physics and thin film research and the inventor of Low Energy Electron Microscopy (LEEM), Spin;

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Electron Diffraction in the Transmission Electron Microscope

This book is a practical guide to electron diffraction in the transmission electron microscope (TEM). Case studies and examples are used to;

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Scanning Electron Microscope Optics And Spectrometers

This book contains proposals to redesign the scanning electron microscope, so that it is more compatible with other charged particle beam;

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Spin-Polarized Two-Electron Spectroscopy of Surfaces

information on the spin-dependent sample electronic structure. Detailed energy and angular distributions of electron pairs carry information on the;

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Many-Body Approach to Electronic Excitations

, optical spectroscopy, and electron energy loss/inelastic X-ray spectroscopy. Important approximations are derived and discussed in the light;

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Principles of Electron Optics, Volume 1

self-contained, detailed, modern account of electron optics for anyone involved with particle beams of modest current density in the energy;

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Principles of Electron Optics, Volume 4

with the Dirac or Schrdinger equation as a starting point. Knowledge of this branch of the subject is essential to understanding electron;

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Fabrication and Physical Properties of Novel Two dimensional Crystal Materials B

microscope (STM), low energy electron diffraction (LEED), scanning transmission electron microscope (STEM), and angle-resolved photoemission;

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Fabrication and Physical Properties of Novel Two dimensional Crystal Materials B

microscope (STM), low energy electron diffraction (LEED), scanning transmission electron microscope (STEM), and angle-resolved photoemission;

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Characterization of Metals and Alloys

, Energy-Dispersive X-Ray Spectroscopy, Neutron Activation Analysis, Scanning Electron Microscopy, and Transmission Electron Spectroscopy;

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An Introduction to Surface Analysis by XPS and AES

Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) techniques. It starts with an examination of the basic concepts of electron;

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Electron Paramagnetic Resonance Spectroscopy

This book shows how the fundamentals of electron paramagnetic resonance (EPR) spectroscopy are practically implemented and illustrates the;

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Electron Paramagnetic Resonance Spectroscopy

This book shows how the fundamentals of electron paramagnetic resonance (EPR) spectroscopy are practically implemented and illustrates the;

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The Transmission Electron Microscope

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