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Reflection Electron Microscopy and Spectroscopy for Surface Analysis

(RHEED) and reflection electron energy-loss spectroscopy (REELS) are comprehensively reviewed for the first time. The book is divided into three;

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Reflection Electron Microscopy and Spectroscopy for Surface Analysis

(RHEED) and reflection electron energy-loss spectroscopy (REELS) are comprehensively reviewed for the first time. The book is divided into three;

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Analytical Methods for Polymer Characterization

-visible spectroscopy, infrared spectroscopy, Raman spectroscopy, and nuclear magnetic resonance), thermal analysis (differential scanning;

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Analytical Methods for Polymer Characterization

-visible spectroscopy, infrared spectroscopy, Raman spectroscopy, and nuclear magnetic resonance), thermal analysis (differential scanning;

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Characterization of High Tc Materials and Devices by Electron Microscopy

spectroscopy. The use of scanning tunnelling microscopy for exploring surface morphology, growth processes and the mapping of superconducting carrier;

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Characterization of High Tc Materials and Devices by Electron Microscopy

spectroscopy. The use of scanning tunnelling microscopy for exploring surface morphology, growth processes and the mapping of superconducting carrier;

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Electron Microscopy and Analysis 1997, Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Cambridge, 2-5 September 1997

Electron Microscopy and Analysis 1997 celebrates the centenary anniversary of the discovery of the electron by J.J. Thomson in Cambridge;

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Surface Microscopy with Low Energy Electrons

This book, written by a pioneer in surface physics and thin film research and the inventor of Low Energy Electron Microscopy (LEEM), Spin;

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Characterization of Metals and Alloys

, Energy-Dispersive X-Ray Spectroscopy, Neutron Activation Analysis, Scanning Electron Microscopy, and Transmission Electron Spectroscopy;

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Materials Characterization

microscopy. The second part of the book is concerned with techniques for chemical analysis and introduces X-ray energy dispersive spectroscopy;

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Structural And Chemical Characterization Of Metals, Alloys A

(SEM), X-ray diffraction (XRD), transmission electron microscopy (TEM), Raman spectroscopy, optical microscopy (OM), Fourier transform infrared;

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Structural And Chemical Characterization Of Metals, Alloys,

spectroscopy, optical microscopy (OM), Fourier transform infrared spectroscopy (FTIR), differential thermal analysis (DTA), differential scanning;

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New Horizons of Applied Scanning Electron Microscopy

microscopes can be realized fully. This will take the reader to an entirely new level of scanning electron microscopy and finely-detailed images never;

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Characterization of Optical Materials

Optical materials are prized for their properties such as reflection, refraction, absorption, emission, scattering, and diffraction;

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An Introduction to Surface Analysis by XPS and AES

Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) techniques. It starts with an examination of the basic concepts of electron;

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Scanning Transmission Electron Microscopy Of Nanomaterials

The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the;

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Characterization of Organic Thin Films

SpectroscopyConcise Summaries of major characterization technologies for organic thin films, including Auger Electron Spectroscopy, Dynamic Secondary Ion Mass;

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Nanocharacterisation

Electron Microscopy, Scanning Transmission Electron Microscopy, Scanning Probe Microscopy, Electron Energy Loss Spectroscopy and Energy Dispersive;

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Advances in Biomaterials

bioprosthesis devices using finite element analysis, and the potential use of electron spectroscopy for chemical analysis for study of biomaterial;

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Spin-Polarized Two-Electron Spectroscopy of Surfaces

This book presents developments of techniques for detection and analysis of two electrons resulting from the interaction of a single;

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Materials Science and Engineering of Carbon

, scanning electron microscopy, image analysis, X-ray photoelectron spectroscopy, magnetoresistance, electrochemical performance, pore structure;

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Inorganic Trace Analytics

analysis via atomic spectrometry, mass spectroscopy, gas chromatography, electron microprobing, or X-ray absorption spectroscopy provides detailed;

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Characterization Of Integrated Circuit Packaging Materials

characterization technologies for integrated circuit packaging materials, including acoustic microscopy, atomic absorption spectrometry, Auger Electron;

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Auger Electron Spectroscopy

of other types of analysis for which an Auger electron spectrometer may be used, for example, secondary electron microscopy, backscattered electron;

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Quantitative Microbeam Analysis

describes the current advances. The book highlights developments relating to Auger electron spectroscopy in scanning electron microscopes and;

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Progress in Nanoscale Characterization and Manipulation

advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical;

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Characterization In Compound Semiconductor Processing

Electron Emission Microscopy, Energy-Dispersive X-Ray Spectroscopy, Neutron Activation Analysis and Raman Spectroscopy;

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