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Atom-Probe Field Ion Microscopy

Atom-probe field ion microscopy is currently the only technique capable of imaging solid surfaces with atomic resolution, and at the same;

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Atom Probe Tomography

ionization, field evaporation and field ion microscopy. The fundamental underlying physics principles are examined, in addition to data;

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Atom Probe Tomography

is described in chapter 3. In addition, the appearance of microstructural features and the information that may be estimated from field ion microscopy;

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Microstructural Characterization Of Materials

recording and analysis, orientation imaging microscopy, focused ion-beam instruments, atom-probe microscopy, and 3-D image reconstruction. As well;

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Quantitative Atomic-Resolution Electron Microscopy

>Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion;

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Physical Metallurgy

added onthe physical metallurgy of light alloys, the physical metallurgy of titanium alloys, atom probe field ion microscopy, computational;

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Kelvin Probe Force Microscopy

This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details;

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Surface and Thin Film Analysis

parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM;

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Scanning Probe Microscopy

Written by three leading experts in the field, this textbook describes and explains all aspects of the scanning probe microscopy. Emphasis;

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Scanning Probe Microscopy

Written by three leading experts in the field, this textbook describes and explains all aspects of the scanning probe microscopy. Emphasis;

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Atom Probe Tomography

theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques, and includes;

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Nanocharacterisation

X-ray Analysis, 3D Characterisation, Scanning Electron and Ion Microscopy and In situ Microscopy. Essentially a handbook to all working;

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Microscopy of Semiconducting Materials 1987, Proceedings of the Institute of Physics Conference, Oxford University, April 1987

that is being made in semiconductor microscopy, primarily in electron probe methods as well as in light optical and ion scattering techniques;

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Progress in Nanoscale Characterization and Manipulation

growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent;

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Scanning Probe Microscopy

Scanning Probe Microscopy (SPM) is the enabling tool for nano(bio)technology, which has opened new vistas in many interdisciplinary;

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Magnetic Microscopy of Nanostructures

A comprehensive collection of overview articles on novel microscopy methods for imaging magnetic structures on the nanoscale. Written by;

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Applications of Microscopy in Materials and Life Sciences

emerging opportunities and challenges in the field of materials sciences, life sciences and microscopy techniques. The contents of this volume;

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Atom Resolved Surface Reactions

kinetic studies stand up to scrutiny at the atom-resolved level? . In taking this approach the reader, new to the field of surface chemistry;

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Fast Ion-atom And Ion-molecule Collisions

intermediate and high energy ion-atom and ion-molecule collisions. The focus is on the most frequently studied processes: electron capture, ionization;

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Scanning Probe Microscopy For Energy Research

atomic, their functionality has remained Terra Incognitae. In this volume, we provide a summary of recent advances in scanning probe microscopy;

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Nanoimaging

complexes and membrane surface topography; and (4) complementary techniques on correlative microscopy, soft x-ray tomography and secondary ion mass;

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Electron Microscopy and Analysis 2003

Electron microscopy is now a mainstay characterization tool for solid state physicists and chemists as well as materials scientists;

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Quantum Theory of High-Energy Ion-Atom Collisions

experts, this book provides a state-of-the-art review of the non-relativistic theory of high-energy ion-atom collisions. Special attention is paid;

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Quantum Theory of High-Energy Ion-Atom Collisions

experts, this book provides a state-of-the-art review of the non-relativistic theory of high-energy ion-atom collisions. Special attention is paid;

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Correlative Imaging

. Starting with a brief historical overview of how the field evolved, it presents the latest developments in microscopy that facilitate the;

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Helium Ion Microscopy

This book covers the fundamentals of Helium Ion Microscopy (HIM) including the Gas Field Ion Source (GFIS), column and contrast formation;

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Scanning Probe Microscopy of Soft Matter

Well-structured and adopting a pedagogical approach, this self-contained monograph covers the fundamentals of scanning probe microscopy;

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