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Kelvin Probe Force Microscopy

This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details;

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Scanning Probe Microscopy

Written by three leading experts in the field, this textbook describes and explains all aspects of the scanning probe microscopy. Emphasis;

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Scanning Probe Microscopy

Written by three leading experts in the field, this textbook describes and explains all aspects of the scanning probe microscopy. Emphasis;

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Scanning Probe Microscopy of Soft Matter

Well-structured and adopting a pedagogical approach, this self-contained monograph covers the fundamentals of scanning probe microscopy;

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The Kelvin Probe for Surface Engineering

Kelvin probe. In surface engineering, the probe is considered the most powerful non-destructive technique used to understand active and passive;

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Atomic Force Microscopy in Biomedical Research

visualize results, atomic force microscopy (AFM) has revolutionized the study of the smallest aspects of life. Atomic Force Microscopy;

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Scanning Force Microscopy of Polymers

], which determines their performance. Thus, research aiming at visualizing structure and morphology using a multitude of microscopy techniques has;

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Microstructural Characterization Of Materials

of probe form the basis for optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy. Microstructural;

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Atom-Probe Field Ion Microscopy

Atom-probe field ion microscopy is currently the only technique capable of imaging solid surfaces with atomic resolution, and at the same;

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Theory and Modeling of Cylindrical Nanostructures for High-Resolution Coverage Spectroscopy

(oxides, SiO2, Si3N4, glass etc.), through height measurements performed by scanning probe microscopy techniques, like Atomic Force Microscopy;

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Scanning Probe Microscopy

Scanning Probe Microscopy (SPM) is the enabling tool for nano(bio)technology, which has opened new vistas in many interdisciplinary;

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Correlating structure and function in small molecule organic solar cells by means of scanning probe and electron microscopy

under operating conditions. In a detailed analytical study using photoelectron spectroscopy and in-operando scanning Kelvin probe microscopy it;

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Scanning Probe Microscopy and Spectroscopy

The investigation and manipulation of matter on the atomic scale have been revolutionised by scanning tunnelling microscopy and related;

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Force Microscopy

secretion and membrane fusion in cells, using approaches that combine AFM, electron microscopy, X-ray diffraction, photon correlation spectroscopy;

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Confocal Microscopy, An Issue of Dermatologic Clinics

Microscopy. Articles in this timely issue include: Basics of Confocal Microscopy and the Complexity of Diagnosing Skin Tumors: New Imaging Tools;

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Scanning Probe Microscopy For Industrial Applications

Covering a diverse range of practical applications and real-world examples, Scanning Probe Microscopy for Industrial Applications examines;

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Semiconductor Material and Device Characterization

, two new chapters have been added: * Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This;

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Correlative Imaging

. Starting with a brief historical overview of how the field evolved, it presents the latest developments in microscopy that facilitate the;

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Magnetic Microscopy of Nanostructures

A comprehensive collection of overview articles on novel microscopy methods for imaging magnetic structures on the nanoscale. Written by;

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Noncontact Atomic Force Microscopy

This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and;

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Scanning Electron Microscopy

Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The;

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Polymer Adhesion, Friction, and Lubrication

biomacromolecular systems. Topics include the use of atomic force microscopy (AFM) to analyze nanotribology, polymer thin films and brushes, nanoparticles;

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Atom Probe Tomography

ionization, field evaporation and field ion microscopy. The fundamental underlying physics principles are examined, in addition to data;

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Noncontact Atomic Force Microscopy 2

Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved;

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Electron Microscopy and Analysis 2003

Electron microscopy is now a mainstay characterization tool for solid state physicists and chemists as well as materials scientists;

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Atomic Force Microscopy

force microscopy. There are a few algebra-based mathematical relationships included in the book that describe the mechanical properties;

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Atomic Force Microscopy

force microscopy. There are a few algebra-based mathematical relationships included in the book that describe the mechanical properties;

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