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Written by three leading experts in the field, this textbook describes and explains all aspects of the scanning probe microscopy. Emphasis;
Vergelijkbare producten zoals Scanning Probe Microscopy
Written by three leading experts in the field, this textbook describes and explains all aspects of the scanning probe microscopy. Emphasis;
Vergelijkbare producten zoals Scanning Probe Microscopy
technique applied by a few scanning probe microscopy experts into a tool used by numerous research and development groups around the globe. This;
Vergelijkbare producten zoals Kelvin Probe Force Microscopy
The investigation and manipulation of matter on the atomic scale have been revolutionised by scanning tunnelling microscopy and related;
Vergelijkbare producten zoals Scanning Probe Microscopy and Spectroscopy
Well-structured and adopting a pedagogical approach, this self-contained monograph covers the fundamentals of scanning probe microscopy;
Vergelijkbare producten zoals Scanning Probe Microscopy of Soft Matter
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The;
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Covering a diverse range of practical applications and real-world examples, Scanning Probe Microscopy for Industrial Applications examines;
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Scanning Probe Microscopy (SPM) is the enabling tool for nano(bio)technology, which has opened new vistas in many interdisciplinary;
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A comprehensive collection of overview articles on novel microscopy methods for imaging magnetic structures on the nanoscale. Written by;
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Electron Microscopy, Scanning Transmission Electron Microscopy, Scanning Probe Microscopy, Electron Energy Loss Spectroscopy and Energy Dispersive;
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microscopy and different forms of electron microscopy (Scanning Electron Micr- copy, SEM; Transmission Electron Microscopy, TEM; Environmental;
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of probe form the basis for optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy. Microstructural;
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surfaces and interfaces at atomic resolution. A useful comparison is given with two related techniques, electron microscopy and scanning tunnelling;
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(oxides, SiO2, Si3N4, glass etc.), through height measurements performed by scanning probe microscopy techniques, like Atomic Force Microscopy;
Vergelijkbare producten zoals Theory and Modeling of Cylindrical Nanostructures for High-Resolution Coverage Spectroscopy
atomic, their functionality has remained Terra Incognitae. In this volume, we provide a summary of recent advances in scanning probe microscopy;
Vergelijkbare producten zoals Scanning Probe Microscopy For Energy Research
Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology, Second Edition describes the recommended;
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This book presents a unified view of the rapidly growing field of scanning tunneling microscopy and its many derivatives. After examining;
Vergelijkbare producten zoals Scanning Tunneling Microscopy and Its Application
Electron microscopy is now a mainstay characterization tool for solid state physicists and chemists as well as materials scientists;
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The book's objective is to present the capabilities of state-of-the-art synchrotron radiation and scanning probe microscopy techniques;
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or microbial corrosion. Examples include confocal laser microscopy, scanning probe microscopy, Fourier Transform infrared spectroscopy;
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commercialization of scanning probe microscopy. The scanning tunneling microscope (STM) has been hailed as the key enabling discovery for nanotechnology;
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Electron Microscopy and Analysis 1997 celebrates the centenary anniversary of the discovery of the electron by J.J. Thomson in Cambridge;
Vergelijkbare producten zoals Electron Microscopy and Analysis 1997, Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Cambridge, 2-5 September 1997
Scanning Capacitance Microscopy is een boek van Wolfgang Brezna;
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throughout covers light-sheet microscopy, image scanning microscopy, and much more. An array of practical techniques are discussed, from classical;
Vergelijkbare producten zoals Introduction to Optical Microscopy
, x-ray techniques, microanalysis, and advanced scanning microscopy techniques. Contributed by numerous international experts, this volume;
Vergelijkbare producten zoals Microscopy of Semiconducting Materials 1987, Proceedings of the Institute of Physics Conference, Oxford University, April 1987
In modern scanning electron microscopy, sample surface preparation is of key importance, just as it is in transmission electron microscopy;
Vergelijkbare producten zoals New Horizons of Applied Scanning Electron Microscopy
experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning;
Vergelijkbare producten zoals Characterization of High Tc Materials and Devices by Electron Microscopy
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