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This book offers, from both a theoretical and a computational perspective, an analysis of macroscopic mathematical models for description;
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FET performances, short channel effects, transcapacitances, asymmetric operation, thermal noise, interface traps, and the junction FET;
Vergelijkbare producten zoals Modeling Nanowire and Double-Gate Junctionless Field-Effect Transistors
This book presents the material necessary for understanding the physics, operation, design, and performance of modern MOSFETs with;
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function and harmony search optimization algorithm, DNA-NAND gate, triple gate SOI MOSFET, micro-Raman and FTIR analysis, high-k dielectric gate;
Vergelijkbare producten zoals Advances in Electronics, Communication and Computing
formation and defects at interfaces, for both conventional Si and alternative channel (Ge or III-V) systems. Several papers address reliability;
Vergelijkbare producten zoals CMOS Gate-Stack Scaling Materials, Interfaces and Reliability Implications
formation and defects at interfaces, for both conventional Si and alternative channel (Ge or III-V) systems. Several papers address reliability;
Vergelijkbare producten zoals CMOS Gate-Stack Scaling Materials, Interfaces and Reliability Implications
the drain/source and channel regions or simply MOSFET gate layout change. These interesting layout structures are capable of incorporating new;
Vergelijkbare producten zoals Layout Techniques for MOSFETs
interface layer. Interface layer optimization was conducted in terms of mobility, swing, and short channel effect using deep submicron MOSFET;
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modeled accurately and simulated for a 1 ??m channel length n-MOSFET. In addition, subthreshold slope which is an indicator of how speedily the;
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modeled accurately and simulated for a 1 $u$ m channel length $n$-MOSFET. In addition, subthreshold slope which is an indicator of how speedily;
Vergelijkbare producten zoals Low Substrate Temperature Modeling Outlook of Scaled n-MOSFET
modeled accurately and simulated for a 1 $u$ m channel length $n$-MOSFET. In addition, subthreshold slope which is an indicator of how speedily;
Vergelijkbare producten zoals Low Substrate Temperature Modeling Outlook of Scaled n-MOSFET
technology with the high-k gate dielectric materials is covered as is the advanced MOSFET structure, with its working structure and modeling. This;
Vergelijkbare producten zoals High-k Gate Dielectric Materials
orientations and strain conditions, and new channel and gate stack materials * All the relevant transport regimes, ranging from low field mobility to;
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) through 72 in. (1,800 mm), and outside screw and yoke (OS&Y) rising-stem gate valves, 3 in. (75 mm) through 72 in. (1,650 mm), with either double;
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, stacked thin film and double gate memories, terrabit vertical channel and vertical gate stacked NAND flash, large scale stacking of Resistance RAM;
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the gate length and became significant for short channel devices. The influence of the off-state bias on the dielectric break;
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complexity, variability, and reliability issues. It comprehensively explores the FinFET/tri-gate architectures with their circuit/SRAM suitability;
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complexity, variability, and reliability issues. It comprehensively explores the FinFET/tri-gate architectures with their circuit/SRAM suitability;
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Vergelijkbare producten zoals Opening of the Cerebral Gate .. Gate .. GATE. TRANSLLUSION, CD
covering the physics, materials, devices, and fabrication processes for high-k gate dielectric materials, Nano-CMOS Gate Dielectric Engineering;
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efficiency and comparison silicon versus GaN transistors. Solutions are presented on the system and circuit level for highly integrated gate drivers;
Vergelijkbare producten zoals Highly Integrated Gate Drivers for Si and GaN Power Transistors
efficiency and comparison silicon versus GaN transistors. Solutions are presented on the system and circuit level for highly integrated gate drivers;
Vergelijkbare producten zoals Highly Integrated Gate Drivers for Si and GaN Power Transistors
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