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MOSFETs

signals. It is by far the most common field-effect transistor in both digital and analog circuits. The MOSFET is composed of a channel of n-type;

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Charge Transport in Low Dimensional Semiconductor Structures: The Maximum Entropy Approach

This book offers, from both a theoretical and a computational perspective, an analysis of macroscopic mathematical models for description;

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Modeling Nanowire and Double-Gate Junctionless Field-Effect Transistors

FET performances, short channel effects, transcapacitances, asymmetric operation, thermal noise, interface traps, and the junction FET;

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Nanometer CMOS

This book presents the material necessary for understanding the physics, operation, design, and performance of modern MOSFETs with;

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Advances in Electronics, Communication and Computing

function and harmony search optimization algorithm, DNA-NAND gate, triple gate SOI MOSFET, micro-Raman and FTIR analysis, high-k dielectric gate;

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CMOS Gate-Stack Scaling Materials, Interfaces and Reliability Implications

formation and defects at interfaces, for both conventional Si and alternative channel (Ge or III-V) systems. Several papers address reliability;

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CMOS Gate-Stack Scaling Materials, Interfaces and Reliability Implications

formation and defects at interfaces, for both conventional Si and alternative channel (Ge or III-V) systems. Several papers address reliability;

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Layout Techniques for MOSFETs

the drain/source and channel regions or simply MOSFET gate layout change. These interesting layout structures are capable of incorporating new;

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Hf-based High-k Dielectrics

interface layer. Interface layer optimization was conducted in terms of mobility, swing, and short channel effect using deep submicron MOSFET;

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Low Substrate Temperature Modeling Outlook of Scaled n-MOSFET

modeled accurately and simulated for a 1 ??m channel length n-MOSFET. In addition, subthreshold slope which is an indicator of how speedily the;

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Low Substrate Temperature Modeling Outlook of Scaled n-MOSFET

modeled accurately and simulated for a 1 $u$ m channel length $n$-MOSFET. In addition, subthreshold slope which is an indicator of how speedily;

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Low Substrate Temperature Modeling Outlook of Scaled n-MOSFET

modeled accurately and simulated for a 1 $u$ m channel length $n$-MOSFET. In addition, subthreshold slope which is an indicator of how speedily;

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High-k Gate Dielectric Materials

technology with the high-k gate dielectric materials is covered as is the advanced MOSFET structure, with its working structure and modeling. This;

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Nanoscale Mos Transistors

orientations and strain conditions, and new channel and gate stack materials * All the relevant transport regimes, ranging from low field mobility to;

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AWWA C500-19 Metal-Seated Gate Valves for Water Supply Service

) through 72 in. (1,800 mm), and outside screw and yoke (OS&Y) rising-stem gate valves, 3 in. (75 mm) through 72 in. (1,650 mm), with either double;

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Vertical 3D Memory Technologies

, stacked thin film and double gate memories, terrabit vertical channel and vertical gate stacked NAND flash, large scale stacking of Resistance RAM;

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Reliability of high-k / metal gate field-effect transistors considering circuit operational constraints

the gate length and became significant for short channel devices. The influence of the off-state bias on the dielectric break;

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Spacer Engineered FinFET Architectures

complexity, variability, and reliability issues. It comprehensively explores the FinFET/tri-gate architectures with their circuit/SRAM suitability;

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Spacer Engineered FinFET Architectures

complexity, variability, and reliability issues. It comprehensively explores the FinFET/tri-gate architectures with their circuit/SRAM suitability;

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Nano-CMOS Gate Dielectric Engineering

covering the physics, materials, devices, and fabrication processes for high-k gate dielectric materials, Nano-CMOS Gate Dielectric Engineering;

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Highly Integrated Gate Drivers for Si and GaN Power Transistors

efficiency and comparison silicon versus GaN transistors. Solutions are presented on the system and circuit level for highly integrated gate drivers;

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Highly Integrated Gate Drivers for Si and GaN Power Transistors

efficiency and comparison silicon versus GaN transistors. Solutions are presented on the system and circuit level for highly integrated gate drivers;

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