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Terrestrial Neutron-induced Soft Error In Advanced Memory Devices

Terrestrial neutron-induced soft errors in semiconductor memory devices are currently a major concern in reliability issues. Understanding;

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Soft Errors

: From Particles to Circuits addresses the problem of soft errors in digital integrated circuits subjected to the terrestrial natural radiation;

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Soft Errors

: From Particles to Circuits addresses the problem of soft errors in digital integrated circuits subjected to the terrestrial natural radiation;

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Terrestrial Radiation Effects in ULSI Devices and Electronic Systems

. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including electrons, alpha-rays, muons;

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Soft Matter Nanotechnology

mere structure-making and places the emphasis firmly on imparting functionality to soft nanomaterials with a focus on devices and applications;

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Variation-Aware Advanced CMOS Devices and SRAM

the applications of novel CMOS devices to cache memory (or Static Random Access Memory, SRAM). The author places emphasis on the physical;

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Nanomaterials-Based Charge Trapping Memory Devices

Rising consumer demand for low power consumption electronics has generated a need for scalable and reliable memory devices with low power;

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Advanced Error Control Techniques for Data Storage Systems

selected from the highly popular Coding and Signal Processing for Magnetic Recording Systems, Advanced Error Control Techniques for Data Storage;

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Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs

This book evaluates the influence of process variations (e.g. work-function fluctuations) and radiation-induced soft errors in a set;

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Mitigating Process Variability and Soft Errors at Circuit Level for FinFETs

This book evaluates the influence of process variations (e.g. work-function fluctuations) and radiation-induced soft errors in a set;

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Neutron Diffraction

-H-D systems; a study on the residual strain induced by thermal hysteresis in a composite material; and neutron diffractometers for fatigue;

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Physics & Chemistry of Fission

Distributions in Low Energy Fission; Double-Energy, Double-Velocity Measurement of Fission Fragments from Thermal Neutron Induced Fission; Odd-Even;

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Laser Growth and Processing of Photonic Devices

and fabrication is followed by consideration of laser-based micro- and nano-fabrication, laser-induced soft matter organization and;

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Architecture Design for Soft Errors

practitioners in semi-conductor industry, researchers and developers in computer architecture, advanced graduate seminar courses on soft errors, and (iv;

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Terrestrial Water Cycle & Climate Change

The Terrestrial Water Cycle: Natural and Human-Induced Changes is a comprehensive volume that investigates the changes in the terrestrial;

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Soft Error Reliability of VLSI Circuits

healthcare electronic systems. The emphasis is on modeling approaches and algorithms for analysis and mitigation of soft errors in nano-scale CMOS;

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Soft Error Reliability of VLSI Circuits

healthcare electronic systems. The emphasis is on modeling approaches and algorithms for analysis and mitigation of soft errors in nano-scale CMOS;

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14 MeV Neutrons

sealed tube generators, well logging sealed tube accelerators, neutron generators with detection of associated alpha particles, plasma devices;

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14 MeV Neutrons

devices, high flux sources, and laser-generated neutron sources Nuclear reactions with 14 MeV neutrons, including measurements of energy;

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Techniques in High Pressure Neutron Scattering

Drawing on the author's practical work from the last 20 years, Techniques in High Pressure Neutron Scattering is one of the first books to;

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Techniques in High Pressure Neutron Scattering

Drawing on the author's practical work from the last 20 years, Techniques in High Pressure Neutron Scattering is one of the first books to;

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Strain-Induced Effects in Advanced MOSFETs

semiconductor films is investigated in devices using analytical k.p and numerical pseudopotential methods. A rigorous overview of transport modeling;

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Nuclear Reactor Physics

more advanced topics as neutron transport theory, neutron slowing down, resonance absorption, neutron thermalization, perturbation and;

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Mechanism . Soft Error, CD

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Amorphous Semiconductors

include solar cells, thin film transistors, sensors, optical memory devices and flat screen devices including televisions;

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Channel and Source Coding for Non-Volatile Flash Memories

Mohammed Rajab proposes different technologies like the error correction coding (ECC), sources coding and offset calibration that aim to;

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Direct and Indirect Human Contributions to Terrestrial Carbon Fluxes

Human-induced climate change is an important environmental issue worldwide, as scientific studies increasingly demonstrate that human;

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