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This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems;
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A practical guide to the effects of radiation on semiconductor components of electronic systems, and techniques for the designing, laying;
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of semiconductor devices, has become a hot topic of investigation. ULSI Devices provides electrical and electronic engineers, applied physicists, and;
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radiation and explains how to effectively control this phenomenon in the design phase of the manufacture of electronic devices.;
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This book introduces the reader to a number of challenges for the operation of electronic devices in various harsh environmental conditions;
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obvious fields in which radiation damage can have serious consequences, i.e., degradation of MOS devices and circuits. Zeroing in on vital aspects;
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Integration (ULSI) refers to semiconductor chips with more than 10 million devices per chip. Written by three renowned pioneers in their field, ULSI;
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simulate radiation transport and the effects of radiation on electronics. The book then: Explains the effects of radiation on;
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radiation transport and the effects of radiation on electronics. The book then: Explains the effects of radiation on digital commercial;
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Reliability of Operating Electronic equipments on board of artificial satellites, spacecrafts, and military aircraft's in extreme;
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The first comprehensive overview describing the effects of ionizing radiation on MOS devices, as well as how to design, fabricate, and test;
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Examines how solar and terrestrial space phenomena affect sophisticated technological systems Contemporary society relies on;
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depending on the orbit to allow electronics engineers to design and select radiation tolerant components and systems, and single event prediction.;
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is (and it will be in the next several decades) the basis of electronic and microelectronic devices. Some MOS devices are faced with the necessity;
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devices and systems as well as the principles of operation of selected novel quantum-based electronic devices and systems. A number of the;
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modeling of novel electronic and optoelectronic devices. The topics covered include devices based on carbon nanotubes, generation and detection;
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introduces the reader to the widely dispersed reliability literature of microelectronic and electronic-optional devices. Reliability and Failure;
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solution to replace the built-to-last electronics predominantly used in implanted devices and electronic gadgets. Their use can reduce the risk;
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There is a growing need to understand and combat potential radiation damage problems in semiconductor devices and circuits. Assessing the;
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mechanisms.It is the first book that comprehensively covers reliability and radiation effects in optoelectronic as well as microelectronic devices. It;
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trends in numerical dosimetry Mobile communication devices and the dosimetry or coupling of radiofrequency (RF) radiation into the human body;
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The thesis covers a broad range of electronic, optical and opto-electronic devices and various predicted physical effects. In particular;
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Reliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single;
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quantitative measurement of the interactions of solar and terrestrial radiation with molecules, aerosols, and cloud particles in planetary atmospheres;
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, temperature, radiation, shock, and vibration. Non-operating reliability is especially critical for life-saving electronic products such as fire alarm;
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electronic devices. The potential complications and associated preventative methods with utilising RFCA are also described. Cardiac;
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researchers in the area of ferroelectric materials. Topics include materials, processes, properties, and electronic devices based on these materials;
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