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Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs

authors also explore four circuit-level techniques (e.g. transistor reordering, decoupling cells, Schmitt Trigger, and sleep transistor) as;

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Mitigating Process Variability and Soft Errors at Circuit Level for FinFETs

authors also explore four circuit-level techniques (e.g. transistor reordering, decoupling cells, Schmitt Trigger, and sleep transistor) as;

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Soft Errors

strategies for the soft error-rate estimation in digital circuits Explores trends for future technological nodes and emerging devices;

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Soft Errors

error-rate estimation in digital circuits Explores trends for future technological nodes and emerging devices Soft Errors: From Particles to;

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VLSI and Post-CMOS Electronics

-CMOS device and circuit design, high-performance compound semiconductor devices and applications, process variability in FinFETs, and other;

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Compact Models for Integrated Circuit Design

fundamental and practical knowledge necessary for efficient integrated circuit (IC) design using nanoscale devices Includes exercise problems at the;

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Compact Models for Integrated Circuit Design

Includes exercise problems at the end of each chapter and extensive references at the end of the book Compact Models for Integrated Circuit;

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CMOS RF Circuit Design for Reliability and Variability

The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter;

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CMOS Nanoelectronics

integration of FinFETs. The book also addresses circuit-related aspects, including the impact of variability on SRAM design, ESD design, and high-T;

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Architecture Design for Soft Errors

the physics of soft errors and reviews current circuit and software mitigation techniques. There are a number of different ways this book can;

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Protecting Chips Against Hold Time Violations Due to Variability

circuits that could be sold for a higher price can be very leaky, and also not very appropriate for sale. A main consequence of power variability;

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Integrated Nanodevice and Nanosystem Fabrication

Since its invention, the integrated circuit has necessitated new process modules and numerous architectural changes to improve application;

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Spacer Engineered FinFET Architectures

complexity, variability, and reliability issues. It comprehensively explores the FinFET/tri-gate architectures with their circuit/SRAM suitability;

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Spacer Engineered FinFET Architectures

complexity, variability, and reliability issues. It comprehensively explores the FinFET/tri-gate architectures with their circuit/SRAM suitability;

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Smart STEM-Driven Computer Science Education

learning variability space is defined for each component separately, and then model-driven approaches are applied. The theoretical basis includes;

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Mismatch and Noise in Modern IC Processes

Component variability, mismatch, and various noise effects are major contributors to design limitations in most modern IC processes;

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Dependable Embedded Systems

This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have;

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Switching Arc Phenomena in Transmission Voltage Level Vacuum Circuit Breakers

, it explains how to determine key design parameters for vacuum interrupters and vacuum circuit breakers at transmission voltage level. At the;

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Switching Arc Phenomena in Transmission Voltage Level Vacuum Circuit Breakers

, it explains how to determine key design parameters for vacuum interrupters and vacuum circuit breakers at transmission voltage level. At the;

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Algorithmic and Register-Transfer Level Synthesis

of integrated circuits more actively. Such design tools hold the promise of raising the level of abstraction at which an integrated circuit is designed;

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Terrestrial Neutron-induced Soft Error In Advanced Memory Devices

the mechanism and quantifying soft-error rates are primarily crucial for the design and quality assurance of semiconductor memory devices.This;

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Soft Error Reliability of VLSI Circuits

healthcare electronic systems. The emphasis is on modeling approaches and algorithms for analysis and mitigation of soft errors in nano-scale CMOS;

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Soft Error Reliability of VLSI Circuits

healthcare electronic systems. The emphasis is on modeling approaches and algorithms for analysis and mitigation of soft errors in nano-scale CMOS;

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Nanoelectronic Coupled Problems Solutions

for variability in order to guarantee quality and yield. It also requires the incorporation of higher abstraction levels to allow for system;

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Electromigration Modeling at Circuit Layout Level

increases the failure rate for ICs with decreasing interconnect dimension and increasing number of interconnect levels. Electromigration (EM;

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Trusted Digital Circuits

modifications (i.e. hardware Trojans) at the register-transfer level, gate level and layout level. Various metrics are discussed to quantify circuit;

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Relationships Between Coastal Sea Level and Large Scale Ocean Circulation

Sea Level: Mean, Variability and Change, Both Local and Global , Forcing Factors Affecting Sea Level Changes at the Coast , Sea Level and;

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