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Practical Electron Microscopy

research laboratory situations, and are entirely reliable. Practical Electron Microscopy covers fixation, dehydration and embedding, semi-thin and;

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Characterization of High Tc Materials and Devices by Electron Microscopy

experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning;

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Characterization of High Tc Materials and Devices by Electron Microscopy

experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning;

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The Principles and Practice of Electron Microscopy

some interesting new examples. This indispensable guide to electron microscopy, written by an author with thirty years practical experience;

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Biomedical Electron Microscopy

This comprehensive reference illustrates optimal preparation methods in biological electron microscopy compared with common methodological;

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Introduction to Electron Microscopy for Biologists

This volume demonstrates how cellular and associated electron microscopy contributes to knowledge about biological structural information;

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New Horizons of Applied Scanning Electron Microscopy

In modern scanning electron microscopy, sample surface preparation is of key importance, just as it is in transmission electron microscopy;

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Liquid Cell Electron Microscopy

microscopy, experimental design, resolution, and electron beam effects. A wealth of practical guidance is provided, and applications are described;

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Specimen Preparation for Transmission Electron Microscopy of Materials

Details the essential practical steps which must precede microscopy. Methods for preparing sheet or disc specimens and final thinning;

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Surface Microscopy with Low Energy Electrons

This book, written by a pioneer in surface physics and thin film research and the inventor of Low Energy Electron Microscopy (LEEM), Spin;

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Electron Microscopy and Analysis 1997, Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Cambridge, 2-5 September 1997

Electron Microscopy and Analysis 1997 celebrates the centenary anniversary of the discovery of the electron by J.J. Thomson in Cambridge;

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Quantitative Atomic-Resolution Electron Microscopy

Quantitative Atomic-Resolution Electron Microscopy, Volume 217, the latest release in the Advances in Imaging and Electron Physics series;

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Scanning Electron Microscopy

Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The;

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Aberration-corrected Imaging In Transmission Electron Microscopy: An Introduction (2nd Edition)

Aberration-Corrected Imaging in Transmission Electron Microscopy provides an introduction to aberration-corrected atomic-resolution;

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Diagnostic Electron Microscopy

Integrating detailed methodology with basic interpretation of the commonly encountered diagnostic problems in electron microscopy;

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Scanning Electron Microscopy and X-Ray Microanalysis

This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM;

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Advances in Imaging and Electron Physics

Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor;

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Particles and Waves in Electron Optics and Microscopy

in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices;

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Controlled Atmosphere Transmission Electron Microscopy: Principles and Practice

This book illustrates the practical workings of environmental transmission electron microscopy (ETEM) from history and instrument design;

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Logarithmic Image Processing: Theory and Applications

in Electronics and Electron Physics and Advances in Optical and Electron Microscopy and features cutting-edge articles on recent developments in all;

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Electron BeamSpecimen Interactions and Simulation Methods in Microscopy

A detailed presentation of the physics of electron beam-specimen interactions Electron microscopy is one of the most widely used;

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Advances in Imaging and Electron Physics

in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices;

Vergelijkbare producten zoals Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics

in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices;

Vergelijkbare producten zoals Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics

in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices;

Vergelijkbare producten zoals Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics

in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices;

Vergelijkbare producten zoals Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics

in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices;

Vergelijkbare producten zoals Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics

in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices;

Vergelijkbare producten zoals Advances in Imaging and Electron Physics