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Diagnostic Electron Microscopy

Integrating detailed methodology with basic interpretation of the commonly encountered diagnostic problems in electron microscopy;

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Diagnostic Electron Microscopy

This text atlas, now in its second edition, presents in simplest form the basic diagnostic criteria used by the electron microscopist;

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Characterization of High Tc Materials and Devices by Electron Microscopy

experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning;

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Characterization of High Tc Materials and Devices by Electron Microscopy

experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning;

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Biomedical Electron Microscopy

This comprehensive reference illustrates optimal preparation methods in biological electron microscopy compared with common methodological;

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Introduction to Electron Microscopy for Biologists

This volume demonstrates how cellular and associated electron microscopy contributes to knowledge about biological structural information;

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New Horizons of Applied Scanning Electron Microscopy

In modern scanning electron microscopy, sample surface preparation is of key importance, just as it is in transmission electron microscopy;

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PEM Fuel Cell Diagnostic Tools

impedance spectroscopy, scanning electron microscopy, and transmission electron microscopy. It also examines special tools developed specifically;

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PEM Fuel Cell Diagnostic Tools

impedance spectroscopy, scanning electron microscopy, and transmission electron microscopy. It also examines special tools developed specifically;

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Surface Microscopy with Low Energy Electrons

This book, written by a pioneer in surface physics and thin film research and the inventor of Low Energy Electron Microscopy (LEEM), Spin;

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Hsiung's Diagnostic Virology

characterization of virus-induced cellular changes seen by light microscopy, as well as virus morphology seen by electron microscopy. The authors cover all;

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Electron Microscopy and Analysis 1997, Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Cambridge, 2-5 September 1997

Electron Microscopy and Analysis 1997 celebrates the centenary anniversary of the discovery of the electron by J.J. Thomson in Cambridge;

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Quantitative Atomic-Resolution Electron Microscopy

Quantitative Atomic-Resolution Electron Microscopy, Volume 217, the latest release in the Advances in Imaging and Electron Physics series;

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Scanning Electron Microscopy

Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The;

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Aberration-corrected Imaging In Transmission Electron Microscopy: An Introduction (2nd Edition)

Aberration-Corrected Imaging in Transmission Electron Microscopy provides an introduction to aberration-corrected atomic-resolution;

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Advances in Imaging and Electron Physics

Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor;

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Particles and Waves in Electron Optics and Microscopy

in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices;

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The Principles and Practice of Electron Microscopy

The first edition of this book was widely praised as an excellent introduction to electron microscopy for materials scientists, physicists;

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Logarithmic Image Processing: Theory and Applications

in Electronics and Electron Physics and Advances in Optical and Electron Microscopy and features cutting-edge articles on recent developments in all;

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Electron BeamSpecimen Interactions and Simulation Methods in Microscopy

A detailed presentation of the physics of electron beam-specimen interactions Electron microscopy is one of the most widely used;

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Advances in Imaging and Electron Physics

in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices;

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Advances in Imaging and Electron Physics

in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices;

Vergelijkbare producten zoals Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics

in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices;

Vergelijkbare producten zoals Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics

in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices;

Vergelijkbare producten zoals Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics

in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices;

Vergelijkbare producten zoals Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics

in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices;

Vergelijkbare producten zoals Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics

in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices;

Vergelijkbare producten zoals Advances in Imaging and Electron Physics