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This book gives a comprehensive account of both experimental and theoretical aspects of electron microprobe analysis, and is an extensively;
Vergelijkbare producten zoals Electron Microprobe Analysis
Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron;
Vergelijkbare producten zoals Electron Microprobe Analysis and Scanning Electron Microscopy in Geology
Now fully updated to cover recent developments, this book covers the closely related techniques of electron microprobe analysis (EMPA) and;
Vergelijkbare producten zoals Electron Microprobe Analysis and Scanning Electron Microscopy in Geology
composition, and its usefulness as diagnostic technique for device degradation. Different types of probes are considered (electrons, photons and tips;
Vergelijkbare producten zoals Microprobe Characterization of Optoelectronic Materials
Electron Microscopy and Analysis 1997 celebrates the centenary anniversary of the discovery of the electron by J.J. Thomson in Cambridge;
Vergelijkbare producten zoals Electron Microscopy and Analysis 1997, Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Cambridge, 2-5 September 1997
. Containing the proceedings from the Electron Microscopy and Analysis Group (EMAG) conference in September 2003, this volume covers current;
Vergelijkbare producten zoals Electron Microscopy and Analysis 2003
analysis of electron diffraction and image data from thin organic materials, this work discusses - with considerable optimism - the prospects;
Vergelijkbare producten zoals Electron Crystallography
highlights strategies to record and interpret large electron diffraction datasets for the analysis of nanostructures. This book;
Vergelijkbare producten zoals Scanning Transmission Electron Microscopy
distributions is discussed. Final chapters consider applications of electron microscopy to the analysis of grain boundaries, thin films and device;
Vergelijkbare producten zoals Characterization of High Tc Materials and Devices by Electron Microscopy
-dimensional Reconstruction, Image Analysis, Instrument Control, Vortex Beams, The Quantum Electron Microscope, and much more. Includes;
Vergelijkbare producten zoals Principles of Electron Optics, Volume 4
distributions is discussed. Final chapters consider applications of electron microscopy to the analysis of grain boundaries, thin films and device;
Vergelijkbare producten zoals Characterization of High Tc Materials and Devices by Electron Microscopy
microscopy, and computer-assisted image analysis. Authored by the key leaders in the biological electron microscopy field
Vergelijkbare producten zoals Biomedical Electron Microscopy
Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts;
Vergelijkbare producten zoals Electron Microscopy and Analysis
Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts;
Vergelijkbare producten zoals Electron Microscopy and Analysis
from 1990, and measurements relying on the electron microprobe and the recent Rutherford backscattering technique were hardly taken into;
Vergelijkbare producten zoals Self-diffusion and Impurity Diffusion in Pure Metals
This book presents developments of techniques for detection and analysis of two electrons resulting from the interaction of a single;
Vergelijkbare producten zoals Spin-Polarized Two-Electron Spectroscopy of Surfaces
Provides a concise yet comprehensive introduction to XPS and AES techniques in surface analysis This accessible second edition of the;
Vergelijkbare producten zoals An Introduction to Surface Analysis by XPS and AES
Electron Energy Loss Spectroscopy (EELS) is a high resolution technique used for the analysis of thin samples of material. The technique;
Vergelijkbare producten zoals Electron Energy Loss Spectroscopy
Quantitative Microbeam Analysis provides a comprehensive introduction to the field of quantitative microbeam analysis (MQA). MQA is a;
Vergelijkbare producten zoals Quantitative Microbeam Analysis
Environment.- S. Fux, M. Reiher: Electron Density in Quantum Theory.- K. Meindl, J.Henn: Residual Density Analysis.- C. Gatti: The Source;
Vergelijkbare producten zoals Electron Density and Chemical Bonding II: Theoretical Charge Density Studies
D. Stalke, U. Flierler: More than Just Distances from Electron Density Studies.- A.O. Madsen: Modeling and Analysis of Hydrogen Atoms;
Vergelijkbare producten zoals Electron Density and Chemical Bonding I: Experimental Charge Density Studies
Advances in Imaging and Electron Physics merges two long-running serials Advances in Electronics and Electron Physics and Advances;
Vergelijkbare producten zoals Advances in Imaging and Electron Physics
polarizing microscope, thin section techniques are being linked with X-ray diffraction, X-ray microprobe, transmission and scanning electron;
Vergelijkbare producten zoals Micromorphology of Soils
In this book the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction;
Vergelijkbare producten zoals Reflection Electron Microscopy and Spectroscopy for Surface Analysis
In this book the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction;
Vergelijkbare producten zoals Reflection Electron Microscopy and Spectroscopy for Surface Analysis
The effect of electron beam treatment upon various materials (oxides, sulfides, ceramics, polymers) is studied to clarify the general;
Vergelijkbare producten zoals Electron Beam Modification of Solids
Analytical Methods for Polymer Characterization presents a collection of methods for polymer analysis. Topics include chromatographic;
Vergelijkbare producten zoals Analytical Methods for Polymer Characterization
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