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Electron Microscopy and Analysis 1997 celebrates the centenary anniversary of the discovery of the electron by J.J. Thomson in Cambridge;
Vergelijkbare producten zoals Electron Microscopy and Analysis 1997, Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Cambridge, 2-5 September 1997
distributions is discussed. Final chapters consider applications of electron microscopy to the analysis of grain boundaries, thin films and device;
Vergelijkbare producten zoals Characterization of High Tc Materials and Devices by Electron Microscopy
distributions is discussed. Final chapters consider applications of electron microscopy to the analysis of grain boundaries, thin films and device;
Vergelijkbare producten zoals Characterization of High Tc Materials and Devices by Electron Microscopy
microscopy, and computer-assisted image analysis. Authored by the key leaders in the biological electron microscopy field
Vergelijkbare producten zoals Biomedical Electron Microscopy
. Containing the proceedings from the Electron Microscopy and Analysis Group (EMAG) conference in September 2003, this volume covers current;
Vergelijkbare producten zoals Electron Microscopy and Analysis 2003
calorimetry and thermogravimetry), microscopy methods (scanning electron microscopy, transmission electron microscopy, and atomic force microscopy;
Vergelijkbare producten zoals Analytical Methods for Polymer Characterization
calorimetry and thermogravimetry), microscopy methods (scanning electron microscopy, transmission electron microscopy, and atomic force microscopy;
Vergelijkbare producten zoals Analytical Methods for Polymer Characterization
Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts;
Vergelijkbare producten zoals Electron Microscopy and Analysis
Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts;
Vergelijkbare producten zoals Electron Microscopy and Analysis
annular dark-field (ADF) data. It showcases the application of machine learning in electron microscopy and the latest advancements in image;
Vergelijkbare producten zoals Scanning Transmission Electron Microscopy
X-ray Analysis, 3D Characterisation, Scanning Electron and Ion Microscopy and In situ Microscopy. Essentially a handbook to all working;
Vergelijkbare producten zoals Nanocharacterisation
Backscattered Scanning Electron Microscopy (BSE) reveals the minerals, textures, and fabrics of sediments and rocks in much greater detail;
Vergelijkbare producten zoals Backscattered Scanning Electron Microscopy And Image Analysis of Sediments And Sedimentary Rocks
Backscattered Scanning Electron Microscopy (BSE) reveals the minerals, textures, and fabrics of sediments and rocks in much greater detail;
Vergelijkbare producten zoals Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary Rocks
This volume demonstrates how cellular and associated electron microscopy contributes to knowledge about biological structural information;
Vergelijkbare producten zoals Introduction to Electron Microscopy for Biologists
and the specimen, the fundamental starting point for all electron microscopy. Detailed explanations are provided to help reinforce;
Vergelijkbare producten zoals Electron BeamSpecimen Interactions and Simulation Methods in Microscopy
This book, written by a pioneer in surface physics and thin film research and the inventor of Low Energy Electron Microscopy (LEEM), Spin;
Vergelijkbare producten zoals Surface Microscopy with Low Energy Electrons
Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron;
Vergelijkbare producten zoals Electron Microprobe Analysis and Scanning Electron Microscopy in Geology
Now fully updated to cover recent developments, this book covers the closely related techniques of electron microprobe analysis (EMPA) and;
Vergelijkbare producten zoals Electron Microprobe Analysis and Scanning Electron Microscopy in Geology
microscopes can be realized fully. This will take the reader to an entirely new level of scanning electron microscopy and finely-detailed images never;
Vergelijkbare producten zoals New Horizons of Applied Scanning Electron Microscopy
, and automated data analysis); and more. Examines the creation of the biological field emission gun scanning electron microscopy;
Vergelijkbare producten zoals Biological Field Emission Scanning Electron Microscopy
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The;
Vergelijkbare producten zoals Scanning Electron Microscopy
Quantitative Atomic-Resolution Electron Microscopy, Volume 217, the latest release in the Advances in Imaging and Electron Physics series;
Vergelijkbare producten zoals Quantitative Atomic-Resolution Electron Microscopy
super resolution and electron microscopy to detect molecules in their native cellular context; low-threshold access to serial section arrays;
Vergelijkbare producten zoals Volume Microscopy
The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the;
Vergelijkbare producten zoals Scanning Transmission Electron Microscopy Of Nanomaterials
electron microscopy imaging in materials and physical sciences. It covers both the broad beam transmission mode (TEM; transmission electron;
Vergelijkbare producten zoals Aberration-corrected Imaging In Transmission Electron Microscopy: An Introduction (2nd Edition)
Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor;
Vergelijkbare producten zoals Advances in Imaging and Electron Physics
in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices;
Vergelijkbare producten zoals Particles and Waves in Electron Optics and Microscopy
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