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Electromigration In Ulsi Interconnections

Electromigration in ULSI Interconnections provides a comprehensive description of the electromigration in integrated circuits. It;

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Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections

Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections provides a detailed description of the application;

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Copper Interconnect Technology

interconnections began to influence circuit performance and will be the primary factors in the evolution of nanoscale ULSI technology. Because metallic;

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Advanced Interconnects for ULSI Technology

interconnects have served well, allowing for the creation of Ultra Large Scale Integration (ULSI) devices which combine over a billion transistors onto;

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A One-Semester Course in Modeling of VSLI Interconnections

, crosstalk noise, and electromigration-induced failure associated with the interconnections in the realistic high-density environment on a chip will;

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Ulsi Semiconductor Technology Atlas

More than 1,100 TEM images illustrate the science of ULSI The natural outgrowth of VLSI (Very Large Scale Integration), Ultra Large Scale;

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ULSI Devices

A complete guide to current knowledge and future trends in ULSI devices Ultra-Large-Scale Integration (ULSI), the next generation;

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Fundamentals of Electromigration-Aware Integrated Circuit Design

The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. It introduces the;

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Fundamentals of Electromigration Aware Integrated Circuit Design

The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. It introduces the;

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Electromigration And Electronic Device Degradation

Electromigration is a mass transport effect in metals under high current densities, which causes the metal atoms to migrate away from a;

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New Approaches to Image Processing based Failure Analysis of Nano-Scale ULSI Devices

New Approaches to Image Processing Based Failure Analysis of Nano-Scale ULSI Devices introduces the reader to transmission and scanning;

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Capillary Electromigration Separation Methods

Capillary Electromigration Separation Methods is a thorough, encompassing reference that not only defines the concept of contemporary;

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Crystal Growth and Evaluation of Silicon for VLSI and ULSI

technological challenges. Crystal Growth and Evaluation of Silicon for VLSI and ULSI is one of the first books to cover the systematic growth;

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Crystal Growth and Evaluation of Silicon for VLSI and ULSI

technological challenges. Crystal Growth and Evaluation of Silicon for VLSI and ULSI is one of the first books to cover the systematic growth;

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Electromigration Modeling at Circuit Layout Level

increases the failure rate for ICs with decreasing interconnect dimension and increasing number of interconnect levels. Electromigration (EM;

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Advanced Chromatographic and Electromigration Methods in BioSciences

) of biologically relevant compounds. It is assumed that the potential reader is familiar with the basics of chromatographic and electromigration methods;

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Mega-Bit Memory Technology - From Mega-Bit to Giga-Bit

) process technologies-the longstanding technology driver of Si ULSI-as they advance from the 1 Kbit to the Gbit DRAM era.;

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Mega-Bit Memory Technology - From Mega-Bit to Giga-Bit: From Mega-Bit to Giga-Bit

) process technologies-the longstanding technology driver of Si ULSI-as they advance from the 1 Kbit to the Gbit DRAM era.;

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Frontiers of Bioanalytical Chemistry

, bioelectroanalysis, nanoparticles, quantitative NMR, mass spectrometry, immunosensors and -assays, or chiral electromigration techniques. Originally;

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Nubian Interconnections

This special guest-edited fascicle of the Journal of Ancient Egyptian Interconnections focuses on Nu;...

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Solder Materials

, physical metallurgy, mechanical properties, electromigration, and reliability of solder joint. The scope of this book covers mainly, but not;

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Ancient Mediterranean Interconnections

It is with the greatest pleasure that the editors of the Journal of Ancient Egyptian Interconnection;...

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Institutional Interconnections and Cross-Boundary Cooperation in Inclusive Business

The success or failure of inclusive business often depends on institutional interconnections. By exa;...

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Trinity

What is so creative and fruitful about Anne Hunt's work on the Trinity is her unique focus on interc;...

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Reliability and Failure of Electronic Materials and Devices

models used to explain degradation, and the statistical handling of lifetime data. Electromigration, dielectric radiation damage and the;

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Doing culture under state-socialism: Actors, events, and interconnections

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Terrestrial Radiation Effects in ULSI Devices and Electronic Systems

. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including electrons, alpha-rays, muons;

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