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Thermal Testing of Integrated Circuits

present the feasibility of considering temperature as an observable for testing purposes, with full coverage of the state of the art.;

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Thermal-Aware Testing of Digital VLSI Circuits and Systems

This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at;

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Thermal-Aware Testing of Digital VLSI Circuits and Systems

This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at;

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Design of 3D Integrated Circuits and Systems

profoundly increases the system functionality, it also exponentially increases the design complexity. Design of 3D Integrated Circuits and;

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Design of 3D Integrated Circuits and Systems

profoundly increases the system functionality, it also exponentially increases the design complexity. Design of 3D Integrated Circuits and;

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Wafer-Level Testing and Test During Burn-In for Integrated Circuits

Wafer-level testing refers to a critical process of subjecting integrated circuits and semiconductor devices to electrical testing while;

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Advances In 3d Integrated Circuits And Systems

Integrated Circuits and Systems, is written to help readers understand 3D integrated circuits in three stages: device basics, system level management;

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Advances In 3d Integrated Circuits And Systems

Integrated Circuits and Systems, is written to help readers understand 3D integrated circuits in three stages: device basics, system level management;

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Digital Integrated Circuit Testing from a Quality Perspective

Applies the methods of modern quality to the testing of digital integrated circuits. Explains new paradigms and techniques ranging from SSI;

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Building Integrated Photovoltaic Thermal Systems

system components, long-term performance and testing, and the commercialization of building integrated photovoltaic thermal (BIPVT) systems. By;

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Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits

and quality issues. Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits covers common problems in areas such as process;

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Test and Diagnosis of Analogue, Mixed-signal and RF Integrated Circuits

system including both analogue and digital circuits. Automatic testing becomes crucially important to drive down the overall cost of next;

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Three-dimensional Integrated Circuit Design

), increasing the performance of integrated circuits has become a challenging task. Connecting effectively (interconnect design) all of these chip;

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An Improved Markov Random Field Design Approach For Digital Circuits

circuit design. Markov Random Field (MRF) is an effective approach that achieves fault-tolerance in integrated circuit design. The previous;

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Digital Integrated Circuits

, simulations, system testing, and fault detection-allows for better control over the design flow process and, ultimately, for better system results;

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Trusted Digital Circuits

facilitate hardware Trojan detection. Trusted testing is also discussed, enabling design trustworthiness at different steps of the integrated circuit;

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System Level ESD Protection

This book addresses key aspects of analog integrated circuits and systems design related to system level electrostatic discharge (ESD;

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Forrest Mims Engineer's Notebook

/>Review of the BasicsDigital Integrated CircuitsMOS/CMOS Integrated CircuitsTTL/LS Integrated CircuitsLinear;

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Troubleshooting Electronic Circuits: A Guide to Learning Analog Electronics

, Troubleshooting Electronic Circuits: A Guide to Learning Analog Circuits clearly explains proper debugging techniques as well as testing and modifying;

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Optimal Interconnect Networks for 2D and 3D Microchips

We are today in the era of gigascale 2D and 3D integrated circuits. These microchips are typically considered to be "interconnect limited;

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Handbook of 3D Integration, Volume 4

This fourth volume of the landmark handbook focuses on the design, testing and thermal management of 3D-integrated devices, both from a;

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ASIC Design in the Silicon Sandbox

any online entitlements included with the product. Discover How to Design, Build, and Optimize Customized Mixed-Signal Integrated;

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Ageing of Integrated Circuits

This book provides comprehensive coverage of the latest research into integrated circuits' ageing, explaining the causes of this phenomenon;

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Random Testing of Digital Circuits

"Introduces a theory of random testing in digital circuits for the first time and offers practical guidance for the implementation;

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Testing Sequence Dependent Defects

With new technologies that continue to shrink the feature size of integrated circuits into deep sub-micron domain, there is an increasingly;

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Physical Design for 3D Integrated Circuits

Physical Design for 3D Integrated Circuits reveals how to effectively and optimally design 3D integrated circuits (ICs). It also analyzes;

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Physical Design for 3D Integrated Circuits

Physical Design for 3D Integrated Circuits reveals how to effectively and optimally design 3D integrated circuits (ICs). It also analyzes;

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