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Wafer-Level Testing and Test During Burn-In for Integrated Circuits

Wafer-level testing refers to a critical process of subjecting integrated circuits and semiconductor devices to electrical testing while;

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Design of 3D Integrated Circuits and Systems

large-scale integration testing and state-of-the-art low-power testing solutions Complete with experimental results of chip-level 3D;

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Design of 3D Integrated Circuits and Systems

integration testing and state-of-the-art low-power testing solutions Complete with experimental results of chip-level 3D integration schemes tested;

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Digital Integrated Circuits

. Digital Integrated Circuits: Design-for-Test Using Simulink (R) and Stateflow (R) illustrates the construction of Simulink models for digital;

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Testing of Digital Systems

, discussion of testing techniques at different levels of integrated circuit hierarchy and a chapter on system-on-a-chip test synthesis. Written for;

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Thermal-Aware Testing of Digital VLSI Circuits and Systems

circuit level and at system level Describes range of algorithms for addressing thermal-aware test issue, presents comparison of temperature;

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Thermal-Aware Testing of Digital VLSI Circuits and Systems

circuit level and at system level Describes range of algorithms for addressing thermal-aware test issue, presents comparison of temperature;

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Digital Integrated Circuit Testing from a Quality Perspective

to high-level VLSI, and how to match testing methods to the design and physical layout of the device. Accounts for the change in the;

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Materials, Integration and Technology for Monolithic Instruments

The field of integrated circuits is now on the cusp of a new level of integration that can enable an entirely new class of products;

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Materials, Integration and Technology for Monolithic Instruments

The field of integrated circuits is now on the cusp of a new level of integration that can enable an entirely new class of products;

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Test and Diagnosis of Analogue, Mixed-signal and RF Integrated Circuits

for automatic SoC testing. This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal;

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Mismatch and Noise in Modern IC Processes

. Mismatch and Noise in Modern IC Processes examines these related effects and how they affect the building block circuits of modern integrated;

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System Level ESD Protection

) protection. It is an invaluable reference for anyone developing systems-on-chip (SoC) and systems-on-package (SoP), integrated with system-level ESD;

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Handbook of Silicon Wafer Cleaning Technology

wet and plasma-based cleaning technologies that are used for removing contamination, particles, residue, and photoresist from wafer surfaces;

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Design And Characterization Of Integrated Varactors For Rf Applications

methodology for the measurement of integrated varactors, covering on-wafer measurement structures, the calibration process, and detailed descriptions;

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An Introduction to Logic Circuit Testing

An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital;

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Trusted Digital Circuits

vulnerabilities to hardware Trojans at different levels. Readers are introduced to design techniques for preventing hardware Trojan insertion and to;

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Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits

and quality issues. Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits covers common problems in areas such as process;

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Testing Sequence Dependent Defects

higher incidence of sequence dependent defects during manufacturing. Two-pattern tests are therefore being used in manufacturing testing to;

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Microchip Fabrication

evaluation The business of wafer fabrication Devices and integrated circuit formation Integrated circuits Packaging;

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Logic Testing and Design for Testability

focuses on the problem of testing: test generation, fault simulation, and complexity of testing. The second half takes up the problem of design;

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Advanced VLSI Technology

The trend in design and manufacturing of very large-scale integrated (VLSI) circuits is towards smaller devices on increasing wafer;

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Principles of Photonic Integrated Circuits

research in the field, as well as chapter-end summaries and problem sets, Principles of Photonic Integrated Circuits is ideal for any graduate;

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Amplifiers, Comparators, Multipliers, Filters, and Oscillators

transistor models, design methods, and fabrication considerations for high-density integrated circuits in nanometer CMOS processes, and it analyzes;

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Amplifiers, Comparators, Multipliers, Filters, and Oscillators

transistor models, design methods, and fabrication considerations for high-density integrated circuits in nanometer CMOS processes, and it analyzes;

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Principles Of Data Conversion System Design

This advanced text and reference covers the design and implementation of integrated circuits for analog-to-digital and digital-to-analog;

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Production Planning and Control for Semiconductor Wafer Fabrication Facilities

Over the last fifty-plus years, the increased complexity and speed of integrated circuits have radically changed our world. Today;

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