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Scanning Tunneling Microscope and Atomic Force Microscopy

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Introduction to Scanning Tunneling Microscopy Third Edition

The scanning tunnelling microscope (STM) was invented by Binnig and Rohrer and received a Nobel Prize of Physics in 1986. Together with the;

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Atomic Force Microscopy

, behaviors, and intermolecular forces associated with probes used in atomic force microscopy. Relevant figures, tables, and illustrations also appear;

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Atomic Force Microscopy

, behaviors, and intermolecular forces associated with probes used in atomic force microscopy. Relevant figures, tables, and illustrations also appear;

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Noncontact Atomic Force Microscopy 2

spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging;

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Noncontact Atomic Force Microscopy

This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and;

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Scanning Force Microscopy of Polymers

devel- ment of Atomic Force Microscopy (AFM) and other forms of scanning proximity microscopes in the late 1980s [4, 5]. AFM, unlike STM, can be;

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Thermal and Current-Induced Magnetization Switching of Fe/W(110) Nanoislands Investigated by Spin-Polarized Scanning Tunneling Microscopy

Thermal and Current-Induced Magnetization Switching of Fe/W(110) Nanoislands Investigated by Spin-Polarized Scanning Tunneling Microscopy;

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Force Microscopy

A complete examination of the uses of the atomic force microscope in biology and medicine This cutting-edge text, written by a team;

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Few-Cycle Photonics and Optical Scanning-Tunneling Microscopy

Deals with both the ultrashort laser-pulse technology in the few- to mono-cycle region and the laser-surface-controlled scanning-tunneling;

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Kelvin Probe Force Microscopy

devices to sub-molecular and atomic scale electrostatics. In the last 25 years, Kelvin probe force microscopy has developed from a specialized;

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Analytical Methods for Polymer Characterization

calorimetry and thermogravimetry), microscopy methods (scanning electron microscopy, transmission electron microscopy, and atomic force microscopy;

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Analytical Methods for Polymer Characterization

calorimetry and thermogravimetry), microscopy methods (scanning electron microscopy, transmission electron microscopy, and atomic force microscopy;

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Atomic Force Microscopy Based Nanorobotics

-dimensional manipulation force microscopy and parallel imaging/manipulation force microscopy.;

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Atomic Force Microscopy

This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even;

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Atomic and Nanometer-Scale Modification of Materials

of materials. Atomic manipulation techniques ranging from scanning tunneling microscopy to light-pressure lithography, and fabrication approaches;

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Growth of Antimony on Copper. A Scanning Tunneling Microscopy Study

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Nanotechnology: Principles and Practices

also explains the functional principles of essential techniques, such as scanning tunneling microscopy (STM), atomic force microscopy (AFM;

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Fabrication and Physical Properties of Novel Two dimensional Crystal Materials B

microscope (STM), low energy electron diffraction (LEED), scanning transmission electron microscope (STEM), and angle-resolved photoemission;

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Fabrication and Physical Properties of Novel Two dimensional Crystal Materials B

microscope (STM), low energy electron diffraction (LEED), scanning transmission electron microscope (STEM), and angle-resolved photoemission;

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Atomic Force Microscopy in Biomedical Research

on troubleshooting and avoiding known pitfalls. Comprehensive and cutting-edge, Atomic Force Microscopy in Biomedical Research;

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Epitaxial Graphene on Silicon Carbide

probe techniques such as scanning tunneling microscopy and atomic resolution imaging based on transmission electron microscopy. It presents the;

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Scanning Tunneling Microscopy and Its Application

This book presents a unified view of the rapidly growing field of scanning tunneling microscopy and its many derivatives. After examining;

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Fundamentals Of Atomic Force Microscopy : Part I: Foundation

The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air;

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Fundamentals of Atomic Force Microscopy

The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air;

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Atom-Probe Field Ion Microscopy

surfaces and interfaces at atomic resolution. A useful comparison is given with two related techniques, electron microscopy and scanning tunnelling;

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Scanning Probe Microscopy of Soft Matter

Well-structured and adopting a pedagogical approach, this self-contained monograph covers the fundamentals of scanning probe microscopy;

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