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Reliability Wearout Mechanisms in Advanced CMOS Technologies

This invaluable resource tells the complete story of failure mechanisms from basic concepts to the tools necessary to conduct reliability;

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Low Power and Reliable SRAM Memory Cell and Array Design

Success in the development of recent advanced semiconductor device technologies is due to the success of SRAM memory cells. This book;

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Nanoscale CMOS VLSI Circuits

failure. Covering the latest devices, technologies, and processes, Nanoscale CMOS VLSI Circuits: Design for Manufacturability focuses on;

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Esd Physics And Devices

requiring a solid grounding in this important area. The book contains advanced CMOS, Silicon On Insulator, Silicon Germanium, and Silicon Germanium;

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CMOS Electronics

CMOS manufacturing environments are surrounded with symptoms that can indicate serious test, design, or reliability problems, which;

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Optoelectronic Circuits in Nanometer CMOS Technology

This book describes the newest implementations of integrated photodiodes fabricated in nanometer standard CMOS technologies. It also;

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Advanced CMOS Cell Design

about silicon on insulator (SOI) technologies Acquire a full range of circuit simulation tools This Advanced CMOS Circuit Design Toolkit;

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VLSI and Post-CMOS Electronics

novel and emerging technologies. VLSI and Post-CMOS Electronics is a useful reference guide for researchers, engineers and advanced students;

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Circadian Rhythms for Future Resilient Electronic Systems

This book describes methods to address wearout/aging degradations in electronic chips and systems, caused by several physical mechanisms at;

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Next Generation and Advanced Network Reliability Analysis

technologies behind currently evolving NGN and apply advanced Markov modeling and Software Reliability Engineering (SRE) techniques for assessing their;

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CMOS Gate-Stack Scaling Materials, Interfaces and Reliability Implications

To address the increasing demands of device scaling, new materials are being introduced into conventional Si CMOS processing at an;

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CMOS Gate-Stack Scaling Materials, Interfaces and Reliability Implications

To address the increasing demands of device scaling, new materials are being introduced into conventional Si CMOS processing at an;

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Cmos Mems

This edition of 'CMOS-MEMS' was originally published in the successful series 'Advanced Micro & Nanosystems'. Here, the combination of the;

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CMOS RF Circuit Design for Reliability and Variability

The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter;

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Intelligent Integrated Systems

for future intelligent integrated systems. It highlights advanced ailicon-based CMOS technologies. New device and functional architectures are;

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Nanoelectronic Device Applications Handbook

and industry from around the globe. The handbook explores current research into potentially disruptive technologies for a post-CMOS world;

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Digital Design and Fabrication

new chapter on nonvolatile memory technologies. Developing advanced concepts, this sharply focused book- Describes new;

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Reliability, Robustness and Failure Mechanisms of LED Devices

increase in the performance of such technologies. As a result, optoelectronic technologies have replaced the technology of electronic;

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Analog IC Reliability in Nanometer CMOS

This book focuses on modeling, simulation and analysis of analog circuit aging. First, all important nanometer CMOS physical effects;

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Esd

-thermal models and technologies; the state-of-the-art technologies discussed include CMOS, BiCMOS, silicon on insulator (SOI), bipolar technology;

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Reliability of Maintained Systems Subjected to Wear Failure Mechanisms - Theory and Applications

Today, the reliability of systems has become a major issue in most industrial applications. The theoretical approach to estimating;

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Silicon-On-Insulator (SOI) Technology

technologies. These include SOI transistors for radio frequency applications, SOI CMOS circuits for ultralow-power applications, and improving device;

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Radiation Harden Devices and Circuits for Analog Application

, voltage controlled oscillator, charge pump and filters for PLL application are studied. The focus is on and CMOS based technologies; however;

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Tantalum and Niobium-Based Capacitors

, etc. The links between the scientific foundation, breakthrough technologies and outstanding performance and reliability of the capacitors are;

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Materials, Processes and Reliability for Advanced Interconnects for Micro- And Nanoelectronics 2009

technologies. Advanced interconnect structures require the use of porous dielectrics with further reduced k-values and even weaker mechanical;

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Materials, Processes and Reliability for Advanced Interconnects for Micro- And Nanoelectronics 2009

technologies. Advanced interconnect structures require the use of porous dielectrics with further reduced k-values and even weaker mechanical;

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Flicker Noise in CMOS LC Oscillators

CMOS implementations of direct conversion receivers, the architecture most amenable to complete monolithic integration, are hindered by the;

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