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Progress in Nanoscale Characterization and Manipulation

of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern;

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Electron and Ion Microscopy and Microanalysis

The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It;

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Scanning Electron Microscopy and X Ray Microanalysis

field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, electron backscatter;

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Scanning Electron Microscopy and X-Ray Microanalysis

This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM;

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Characterization of High Tc Materials and Devices by Electron Microscopy

-resolution transmission electron microscopy, including a chapter devoted to specimen preparation techniques, and microanalysis by scanning;

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Characterization of High Tc Materials and Devices by Electron Microscopy

-resolution transmission electron microscopy, including a chapter devoted to specimen preparation techniques, and microanalysis by scanning;

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Microscopy of Semiconducting Materials 1987, Proceedings of the Institute of Physics Conference, Oxford University, April 1987

that is being made in semiconductor microscopy, primarily in electron probe methods as well as in light optical and ion scattering techniques;

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Microstructural Characterization Of Materials

of probe form the basis for optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy. Microstructural;

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Quantitative Atomic-Resolution Electron Microscopy

>Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion;

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Advances in Imaging and Electron Physics

interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electron, and ion emission with a valuable;

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Particles and Waves in Electron Optics and Microscopy

interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electron, and ion emission with a valuable;

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MRS Proceedings Advances in Materials Problem Solving with the Electron Microscope

ALCHEMI, electron holography, EBSP in the SEM for phase identification and orientation imaging microscopy, low-voltage microanalysis of bulk;

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Advances in Imaging and Electron Physics

in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices;

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Advances in Imaging and Electron Physics

in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices;

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Nanocharacterisation

X-ray Analysis, 3D Characterisation, Scanning Electron and Ion Microscopy and In situ Microscopy. Essentially a handbook to all working;

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Morphological Image Operators

practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a;

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Advances in Imaging and Electron Physics

>Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electron, and ion;

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Advances in Imaging and Electron Physics

interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electron, and ion emission with a valuable;

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Advances in Imaging and Electron Physics

interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electron, and ion emission with a valuable;

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Advances in Imaging and Electron Physics

interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electron, and ion emission with a valuable;

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Advances in Imaging and Electron Physics

>Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electron and ion;

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Advances in Imaging and Electron Physics

in Electronics and Electron Physics and Advances in Optical and Electron Microscopy features extended articles on the physics of electron devices;

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Atom-Probe Field Ion Microscopy

Atom-probe field ion microscopy is currently the only technique capable of imaging solid surfaces with atomic resolution, and at the same;

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Advances in Imaging and Electron Physics

>Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electron, and ion;

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Analytical, Approximate-Analytical and Numerical Methods in the Design of Energy Analyzers

>Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electron, and ion;

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Advances in Imaging and Electron Physics

>Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons, and ion;

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Advances in Imaging and Electron Physics Including Proceedings CPO-10

practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a;

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