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X-Ray Microscopy

X-Ray Microscopy is een boek van Mairdumont Gmbh & Co. Kg;

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X-Ray Microscopy

use of X-rays for microscopic investigation. Cosslett and Nixon review a variety of techniques used in X-ray microscopy, as well as specimen;

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Scanning Electron Microscopy and X-Ray Microanalysis

) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled;

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Electron Microprobe Analysis and Scanning Electron Microscopy in Geology

instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for;

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Electron Microprobe Analysis and Scanning Electron Microscopy in Geology

, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental;

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STUDY OF 2.3 KJ PLASMA FOCUS AS K-RADIATION (Al, Neon, Cu, Ar) SOURCE

point X-ray source for some special applications like lithiography,contact microscopy,X-ray micromachining, miniature sensors, tomograpy,plasma;

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Analytical Methods for Polymer Characterization

), and x-ray diffraction. The author also discusses mechanical and dynamic mechanical properties.;

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Analytical Methods for Polymer Characterization

), and x-ray diffraction. The author also discusses mechanical and dynamic mechanical properties.;

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Materials Science and Engineering of Carbon

to carbon materials, including X-ray diffraction, X-ray small-angle scattering, transmission electron microscopy, Raman spectroscopy;

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Scanning Electron Microscopy

different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons;

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X-Ray Fluorescence in Biological Sciences - Principles, Instrumentation and Applications

induced X-ray emission (micro-PIXE), electron probe X-ray microanalysis (EPXMA), synchrotron-based X-ray fluorescence microscopy (SXRF, SRIXE, or;

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Materials Characterization

microstructure analysis, including light microscopy, X-ray diffraction, transmission and scanning electron microscopy, as well as scanning probe;

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Solid State Chemistry

microscopy X-ray photoelectron spectroscopy (ESCA) Covalent organic frameworks Graphene oxide and bilayer graphene;

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Solid State Chemistry

microscopy X-ray photoelectron spectroscopy (ESCA) Covalent organic frameworks Graphene oxide and bilayer graphene;

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Microstructural Characterization Of Materials

of probe form the basis for optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy. Microstructural;

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Advances In Imaging And Electron Physics

and x-ray optics and microscopy for an international readership across varying backgrounds and disciplines. Edited by Dr. Ted Cremer, these;

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Medical Imaging Systems

microscopy. This is followed by more complex image formation processes: magnetic resonance imaging, X-ray projection imaging, computed tomography, X;

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In-Situ Characterization of Heterogeneous Catalysts

Spectroscopy); techniques for structural characterization based on X-ray diffraction and scattering; for microscopy and morphological studies; for;

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Advances in Imaging and Electron Physics

and x-ray optics and microscopy for an international readership across varying backgrounds and disciplines. Edited by Dr. Ted Cremer, these;

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Technology to Investigate X-Ray Irradiation Influence

the influence of X-ray irradiation on the structural imperfections in the surface material and subsurface material (i.e. depth of about 10 nm;

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Scanning Electron Microscopy and X Ray Microanalysis

field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, electron backscatter;

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Microscopy of Semiconducting Materials 1987, Proceedings of the Institute of Physics Conference, Oxford University, April 1987

, x-ray techniques, microanalysis, and advanced scanning microscopy techniques. Contributed by numerous international experts, this volume;

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Surface Microscopy with Low Energy Electrons

(PEEM), X-ray Photoemission Electron Microscopy (XPEEM), and their combination with microdiffraction and microspectroscopy, all of which use;

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Nanocharacterisation

X-ray Analysis, 3D Characterisation, Scanning Electron and Ion Microscopy and In situ Microscopy. Essentially a handbook to all working;

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Magnetic Properties of Antiferromagnetic Oxide Materials

-antiferromagnetic interface coupling and oxide multilayers, as well as imaging using soft x-ray microscopy. The result is a very timely monograph for solid;

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Correlative Imaging

methods, and how correlative imaging can incorporate force microscopy, soft x-ray tomography, and volume electron microscopy techniques. Work on;

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Femtosecond Beam Science

extend to the development of femtosecond X-ray sources and fourth generation synchrotron light sources. Dynamic microscopy promises to be one;

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