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On-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits

This book enables readers to design effective ESD protection solutions for all mainstream RF fabrication processes (GaAs pHEMT, SiGe HBT;

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System Level ESD Protection

) protection. It is an invaluable reference for anyone developing systems-on-chip (SoC) and systems-on-package (SoP), integrated with system-level ESD;

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Electrostatic Discharge Protection

Discharge Protection: Advances and Applications delivers timely coverage of component- and system-level ESD protection for semiconductor devices and;

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Electrostatic Discharge Protection

Discharge Protection: Advances and Applications delivers timely coverage of component- and system-level ESD protection for semiconductor devices and;

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Esd

: * Presents methods for co-synthesizisng ESD networks for RF applications to achieve improved performance and ESD protection of semiconductor chips;

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Esd

FINFETs. * Increased focus on ESD power clamps for power rails for CMOS, Bipolar, and BiCMOS. * Co-synthesizing of semiconductor chip architecture;

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ESD Basics

Product Use complements the author s series of books on ESD protection. For those new to the field, it is an essential reference and a useful;

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Electrical Overstress (EOS)

events (CBE), to system level IEC 61000-4-2 test events) * EOS protection on-chip design practices and how they differ from ESD protection;

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ESD in Silicon Integrated Circuits

for VLSI circuits. aeo Provides guidance on the implementation of circuit protection measures. aeo Includes new sections on ESD design rules;

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Electro Static Discharge

Of all the electro magnetic susceptibility problems found during test and in the field, ESD is one of the toughest to overcome. With the;

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Esd

either a technology or circuit methodology. Look inside for extensive coverage on: failure analysis tools, EOS and ESD failure sources and;

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CMOS Analog Integrated Circuits

and low device geometry of complementary metaloxidesemiconductor (CMOS) technologies have accelerated the movement toward system on a chip;

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CMOS Analog Integrated Circuits

and low device geometry of complementary metaloxidesemiconductor (CMOS) technologies have accelerated the movement toward system on a chip;

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Mixed-Signal Circuits

), and biomedical filters Delineates the respective parts of a full system-on-chip (SoC), from the digital parts to the baseband blocks, radio;

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Mixed-Signal Circuits

), from the digital parts to the baseband blocks, radio frequency (RF) circuitries, electrostatic-discharge (ESD) structures, and built-in self;

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Esd

. Look inside for extensive coverage on: * integration of cores, power bussing, and signal pins in DRAM, SRAM, CMOS image processing chips;

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Basic Esd And I/O Design

discharge) protection and input/output design. Addressing the growing demand in industry for high-speed I/O designs, it bridges the gap between ESD;

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Esd Physics And Devices

covers ESD testing, failure criteria and scaling theory for CMOS, SOI (silicon on insulator), BiCMOS and BiCMOS SiGe (Silicon Germanium;

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ESD Testing

of the authors series of books on electrostatic discharge (ESD) protection; this book will be an invaluable reference for the professional;

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What is

packaging of an electronic system must consider protection from mechanical damage, cooling, radio frequency noise emission, protection from;

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The ESD Handbook

discussing ESD protection. Written by a noted expert on the topic, the text offers a topic-by-topic reference that includes illustrative figures;

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Guidebook for Managing Silicon Chip Reliability

latch-up qualification screening guidelines for designing reliability Guidebook for Managing Silicon Chip Reliability focuses on;

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Guidebook for Managing Silicon Chip Reliability

latch-up qualification screening guidelines for designing reliability Guidebook for Managing Silicon Chip Reliability focuses on;

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Parasitic Substrate Coupling in High Voltage Integrated Circuits

characterization of parasitic bipolar transistors, latch-up of the parasitic p-n-p-n structure, and electrostatic discharge (ESD) protection devices;

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ESD Protection Methodologies

Failures caused by electrostatic discharges (ESD) constitute a major problem concerning the reliability and robustness of integrated;

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Computational Intelligence in Analog and Mixed Signal AMS and Radio Frequency

volumes addresses the design of analog and mixed-signal (AMS) and radio-frequency (RF) circuits, with 17 chapters grouped into parts on analog and;

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Computer Integrated Electronics Manufacturing and Testing

assembly, surface mount technology, tape automated bonding, bar coding, and electro-static discharge. Also studies the effects of group work ethics;

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