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of powder diffraction. This prompted a revision, which had to be beyond cosmetic limits. The book was, and remains focused on standard laboratory;
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through the technique of powder X-ray diffraction. Structural studies using powder X-ray diffraction patterns from a laboratory X-ray source at;
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Powder diffraction is a widely used scientific technique in the characterization of materials with broad application in materials science;
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second part then focuses on such characterization techniques as diffraction and scattering methods, as well as direct imaging and tomography. The;
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lose their power when only polycrystalline and nanocrystalline samples are available. It is here that powder diffraction and single-crystal;
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, and chemistry. This informative new book describes the principles of X-ray diffraction and its applications to materials characterization. It;
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, and chemistry. This informative new book describes the principles of X-ray diffraction and its applications to materials characterization. It;
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and recent progress in electron crystallography and associated strategies for structural fingerprinting of nanocrystals. Some consensus;
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Electron backscatter diffraction is a very powerful and relatively new materials characterization technique aimed at the determination;
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of materials at longer length scales than those probed by powder diffraction methods. Addressing both physical principals and recent advances in their;
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Characterization of Materials, 2nd Edition is an introduction to the expertise involved in assessing the microstructure of engineering materials and to the;
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emphasis on applications to geological materials; (2) describe how to obtain high-quality powder diffraction data; and (3) show how to extract;
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This book presents state-of-the-art contributions related to advanced structural characterization techniques in the field of clean energy;
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contains papers presented at Symposium 2D 'Structural and Chemical Characterization of Metals, Alloys and Compounds'. This special issue covers;
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This volume includes papers from the Second International Conference on Characterization and Control of Interfaces for High Quality;
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and graduate students in materials science and analytical chemistry. X-ray powder diffraction-a technique that has matured significantly;
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, thin films, coatings, paints, biomaterials, composites, and more. Two-Dimensional X-Ray Diffraction, Second Edition is an up-to-date resource;
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Spectroscopy); techniques for structural characterization based on X-ray diffraction and scattering; for microscopy and morphological studies; for;
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of materials. * Characterization of structural, morphological, and topographical natures of materials at micro- and nano- scales;
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This proceedings volume features 59 peer-reviewed papers from ICCCI2009 on interface characterization and control technology, powder and;
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Powder diffraction is the mostly widely used crystallographic method, with applications spanning all aspects of structural science. This;
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techniques, morphology and structural characterization by microscopy and diffraction, and thermal analysis. This edition contains a new chapter on;
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techniques, morphology and structural characterization by microscopy and diffraction, and thermal analysis. This edition contains a new chapter on;
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This volume contains papers on phase composition and quantitative x-ray powder diffraction analysis of Portland cement and clinker; neutron;
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, Materials Characterization Techniques presents the principles of widely used, advanced surface and structural characterization techniques for;
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materials properties; and compares these factor to alternative methods of powder and film formation. The title provides the theory needed to;
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behaviour (Engineering). With this focus, Principles of Materials Characterization and Metrology presents a comprehensive discussion of the;
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