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Defects in Microelectronic Materials and Devices

Uncover the Defects that Compromise Performance and ReliabilityAs microelectronics features and devices become smaller and more complex, it;

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Defects in Microelectronic Materials and Devices

Uncover the Defects that Compromise Performance and ReliabilityAs microelectronics features and devices become smaller and more complex, it;

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Encapsulation Technologies for Electronic Applications

in electronic applications, with a primary emphasis on the encapsulation of microelectronic devices and connectors and transformers. It includes;

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Quantum Heterostructures

operating features of modern microelectronic and optoelectronic devices. The authors begin by outlining the trends that have driven development;

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Quantum Heterostructures

operating features of modern microelectronic and optoelectronic devices. The authors begin by outlining the trends that have driven development;

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Encapsulation Technologies for Electronic Applications

handling, assembly, electrical and thermal considerations. Currently, more than 99% of microelectronic devices are plastic encapsulated;

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Defect and Impurity Engineered Semiconductors and Devices

from MRS. Going beyond defect control, the book explores the engineering of desired properties in semiconductor materials and devices through;

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Defects in Optoelectronic Materials

students cutting-edge information on devices and materials interaction.;

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Reliability and Failure of Electronic Materials and Devices

introduces the reader to the widely dispersed reliability literature of microelectronic and electronic-optional devices. Reliability and Failure;

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Microelectronic Materials

of materials used in microelectronics, and can assist in the design of new materials for specific applications. It emphasizes the importance of the;

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Noise in Nanoscale Semiconductor Devices

This book summarizes the state-of-the-art, regarding noise in nanometer semiconductor devices. Readers will benefit from this leading-edge;

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Noise in Nanoscale Semiconductor Devices

This book summarizes the state-of-the-art, regarding noise in nanometer semiconductor devices. Readers will benefit from this leading-edge;

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Microelectronic Materials

of materials used in microelectronics, and can assist in the design of new materials for specific applications. It emphasizes the importance of the;

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Silicon Carbide 2008 Materials, Processing and Devices

, defects, and devices. New developments in the growth of bulk SiC single-crystal materials, advances in the epitaxial growth of SiC, and progress;

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Radiation Defects in Ion Implanted &/or High-Energy Irradiated MOS Structures

is (and it will be in the next several decades) the basis of electronic and microelectronic devices. Some MOS devices are faced with the necessity;

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Lock-In Thermography: Basics and Use for Evaluating Electronic Devices and Materials

This is the first book on lock-in thermography, an analytical method applied to the diagnosis of microelectronic devices. This useful;

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Progress in Solid State Electronics Research

, measurement and evaluation; the physics and modelling of submicron and nanoscale microelectronic devices, including methods of processing, measurement;

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Extended Defects in Semiconductors

role in semiconductor devices, and techniques for their characterization are discussed. These topics are among the central issues in the;

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Extended Defects In Semiconductors

role in semiconductor devices, and techniques for their characterization are discussed. These topics are among the central issues in the;

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Physical Chemistry of Semiconductor Materials and Processes

-devices. Divided into five chapters, it covers: Thermodynamics of solids, including phases and their properties and structural order;

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Solid State Electronics Research Advances

of submicron and nanoscale microelectronic devices, including methods of processing, measurement, and evaluation; and applications of numerical methods;

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Photo-induced Defects in Semiconductors

stability of certain semiconductor devices. After an introductory discussion of metastable defects, the properties of DX and EL2 centres in III-V;

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Photo-Induced Defects in Semiconductors

stability of certain semiconductor devices. After an introductory discussion of metastable defects, the properties of DX and EL2 centres in III-V;

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Materials and Processes for Submicron Technologies

in microelectronic devices directly relating to the reduction in size of features of the devices down to submicron size. When electronic materials are;

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Materials Science in Microelectronics II

/ structure relationship, and the structure / properties relationship. Part II of 'Materials Science in Microelectronics' focuses on the;

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Silicon Carbide: Materials, Processing and Devices

potential of wide band gap SiC for optoelectronic and microelectronic applications.;

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III-Nitride Semiconductors

activity directed towards nitride materials and devices, the publication of the volume is particularly timely. Early pioneering work by Pankove and;

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